Tipless AFM Cantilevers
Tipless AFM Cantilevers

General view of the HQ:NSC35/Tipless and HQ:NSC36/Tipless AFM cantilevers

General view of the HQ:CSC37/Tipless and HQ:CSC38/Tipless AFM cantilevers
n-type silicon
AFM Probe bulk resistivity
0.01-0.025 Ohm*cm
The AFM probes in the Tipless series offer three different AFM cantilevers on one side of the chip without AFM tips. They can be used in various applications such as gluing microspheres or custom tip pyramids. HQ:NSC35 and HQ:NSC36 series AFM probes feature 3 different soft tapping mode AFM cantilevers, while HQ:CSC37 and HQ:CSC38 series AFM probes feature 3 different contact mode AFM cantilevers.
3 AFM Cantilevers Series


| AFM Cantilever | Resonance Frequency, kHz | Force Constant, N/m | |||||
|---|---|---|---|---|---|---|---|
| min | typical | max | min | typical | max | ||
| 35 series | Cantilever A | 130 | 205 | 290 | 2.7 | 8.9 | 24 |
| Cantilever B | 185 | 300 | 430 | 4.8 | 16 | 44 | |
| Cantilever C | 95 | 150 | 205 | 1.7 | 5.4 | 14 | |
| 36 series | Cantilever A | 30 | 90 | 160 | 0.1 | 1.0 | 4.6 |
| Cantilever B | 45 | 130 | 240 | 0.2 | 2 | 9 | |
| Cantilever C | 25 | 65 | 115 | 0.06 | 0.6 | 2.7 | |
| 37 series | Cantilever A | 30 | 40 | 55 | 0.3 | 0.8 | 2 |
| Cantilever B | 15 | 20 | 30 | 0.1 | 0.3 | 0.6 | |
| Cantilever C | 20 | 30 | 40 | 0.1 | 0.4 | 1 | |
| 38 series | Cantilever A | 8 | 20 | 32 | 0.01 | 0.09 | 0.36 |
| Cantilever B | 5 | 10 | 17 | 0.003 | 0.03 | 0.13 | |
| Cantilever C | 6 | 14 | 23 | 0.005 | 0.05 | 0.21 | |
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Application
Tipless AFM cantilevers are often used for custom applications such as for example attaching spheres or other objects for force spectroscopy measurements.
HQ:NSC35/tipless/No Al
Tipless AFM Probe with 3 Different Soft Tapping Mode AFM Cantilevers
AFM probes of the HQ:NSC35 series have three different tipless soft tapping mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
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AFM Probe Specifications
AFM Tip
| Shape |
|---|
| Tipless |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 8.9 N/m(2.7 - 24 N/m) | 205 kHz(130 - 290 kHz) | 110 µm(105 - 115µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
| Cantilever B | Beam | 16 N/m(4.8 - 44 N/m) | 300 kHz(185 - 430 kHz) | 90 µm(85 - 95µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
| Cantilever C | Beam | 5.4 N/m(1.7 - 14 N/m) | 150 kHz(95 - 205 kHz) | 130 µm(125 - 135µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
All typical values
HQ:NSC36/tipless/No Al
Tipless AFM Probe with 3 Different Soft Tapping Mode AFM Cantilevers, Low Force Constant
AFM probes of the HQ:NSC36 series have three different tipless soft tapping mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
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AFM Probe Specifications
AFM Tip
| Shape |
|---|
| Tipless |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 1 N/m(0.1 - 4.6 N/m) | 90 kHz(30 - 160 kHz) | 110 µm(105 - 115µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
| Cantilever B | Beam | 2 N/m(0.2 - 9 N/m) | 130 kHz(45 - 240 kHz) | 90 µm(85 - 95µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
| Cantilever C | Beam | 0.6 N/m(0.06 - 2.7 N/m) | 65 kHz(25 - 115 kHz) | 130 µm(125 - 135µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
All typical values
HQ:CSC37/tipless/No Al
Tipless AFM Probe with 3 Different Contact Mode AFM Cantilevers
AFM probes of the HQ:CSC37 series have three different tipless contact mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
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AFM Probe Specifications
AFM Tip
| Shape |
|---|
| Tipless |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 0.8 N/m(0.3 - 2 N/m) | 40 kHz(30 - 55 kHz) | 250 µm(245 - 255µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
| Cantilever B | Beam | 0.3 N/m(0.1 - 0.6 N/m) | 20 kHz(15 - 30 kHz) | 350 µm(345 - 355µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
| Cantilever C | Beam | 0.4 N/m(0.1 - 1 N/m) | 30 kHz(20 - 40 kHz) | 300 µm(295 - 305µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
All typical values
HQ:CSC38/tipless/No Al
Tipless AFM Probe with 3 Different Contact Mode AFM Cantilevers, Low Force Constant
AFM probes of the HQ:CSC38 series have three different tipless soft contact mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
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AFM Probe Specifications
AFM Tip
| Shape |
|---|
| Tipless |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 0.09 N/m(0.01 - 0.36 N/m) | 20 kHz(8 - 32 kHz) | 250 µm(245 - 255µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
| Cantilever B | Beam | 0.03 N/m(0.003 - 0.13 N/m) | 10 kHz(5 - 17 kHz) | 350 µm(345 - 355µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
| Cantilever C | Beam | 0.05 N/m(0.005 - 0.21 N/m) | 14 kHz(6 - 23 kHz) | 300 µm(295 - 305µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
All typical valuesÂ
HQ:NSC35/tipless/Cr-Au
Tipless AFM Probe with 3 Different Gold Coated Soft Tapping Mode AFM Cantilevers
AFM probes of the HQ:NSC35 series have three different tipless soft tapping mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm Au coating with 20 nm Cr sublayer is electrically conductive and chemically inert. It also ehnances the laser reflectivity of the AFM cantilevers in air and liquids. The coating may cause AFM cantilever bending up to 3°.
Gold Overall
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AFM Probe Specifications
AFM Tip
| Shape |
|---|
| Tipless |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 8.9 N/m(2.7 - 24 N/m) | 205 kHz(130 - 290 kHz) | 110 µm(105 - 115µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
| Cantilever B | Beam | 16 N/m(4.8 - 44 N/m) | 300 kHz(185 - 430 kHz) | 90 µm(85 - 95µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
| Cantilever C | Beam | 5.4 N/m(1.7 - 14 N/m) | 150 kHz(95 - 205 kHz) | 130 µm(125 - 135µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
All typical values
HQ:NSC36/tipless/Cr-Au
Tipless AFM Probe with 3 Different Gold Coated Soft Tapping Mode AFM Cantilevers, Low Force Constant
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AFM Probe Specifications
AFM Tip
| Shape |
|---|
| Tipless |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 1 N/m(0.1 - 4.6 N/m) | 90 kHz(30 - 160 kHz) | 110 µm(105 - 115µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
| Cantilever B | Beam | 2 N/m(0.2 - 9 N/m) | 130 kHz(45 - 240 kHz) | 90 µm(85 - 95µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
| Cantilever C | Beam | 0.6 N/m(0.06 - 2.7 N/m) | 65 kHz(25 - 115 kHz) | 130 µm(125 - 135µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
All typical valuesÂ
HQ:CSC37/tipless/Cr-Au
Tipless AFM Probe with 3 Different Gold Coated Contact Mode AFM Cantilevers
AFM probes of the HQ:CSC37 series have three different tipless contact mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm Au coating with 20 nm Cr sublayer is electrically conductive and chemically inert. It also ehnances the laser reflectivity of the AFM cantilevers in air and liquids. The coating may cause AFM cantilever bending up to 3°.
Gold Overall
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AFM Probe Specifications
AFM Tip
| Shape |
|---|
| Tipless |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 0.8 N/m(0.3 - 2 N/m) | 40 kHz(30 - 55 kHz) | 250 µm(245 - 255µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
| Cantilever B | Beam | 0.3 N/m(0.1 - 0.6 N/m) | 20 kHz(15 - 30 kHz) | 350 µm(345 - 355µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
| Cantilever C | Beam | 0.4 N/m(0.1 - 1 N/m) | 30 kHz(20 - 40 kHz) | 300 µm(295 - 305µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
All typical values
HQ:CSC38/tipless/Cr-Au
Tipless AFM Probe with 3 Different Gold Coated Contact Mode AFM Cantilevers, Low Force Constant
AFM probes of the HQ:CSC38 series have three different tipless soft contact mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm Au coating with 20 nm Cr sublayer is electrically conductive and chemically inert. It also ehnances the laser reflectivity of the AFM cantilevers in air and liquids. The coating may cause AFM cantilever bending up to 3°.
Gold Overall
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AFM Probe Specifications
AFM Tip
| Shape |
|---|
| Tipless |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 0.09 N/m(0.01 - 0.36 N/m) | 20 kHz(8 - 32 kHz) | 250 µm(245 - 255µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
| Cantilever B | Beam | 0.03 N/m(0.003 - 0.13 N/m) | 10 kHz(5 - 17 kHz) | 350 µm(345 - 355µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
| Cantilever C | Beam | 0.05 N/m(0.005 - 0.21 N/m) | 14 kHz(6 - 23 kHz) | 300 µm(295 - 305µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
All typical values
HQ:NSC35/tipless/Al BS
Tipless AFM Probe with 3 Different Soft Tapping Mode AFM Cantilevers, Reflective Aluminum
AFM probes of the HQ:NSC35 series have three different tipless soft tapping mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The aluminum reflective coating enhances the laser reflectivity of the AFM cantilevers by approximately 2.5 times.
Reflective Aluminum
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AFM Probe Specifications
AFM Tip
| Shape |
|---|
| Tipless |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 8.9 N/m(2.7 - 24 N/m) | 205 kHz(130 - 290 kHz) | 110 µm(105 - 115µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
| Cantilever B | Beam | 16 N/m(4.8 - 44 N/m) | 300 kHz(185 - 430 kHz) | 90 µm(85 - 95µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
| Cantilever C | Beam | 5.4 N/m(1.7 - 14 N/m) | 150 kHz(95 - 205 kHz) | 130 µm(125 - 135µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
All typical values
HQ:NSC36/tipless/Al BS
Tipless AFM Probe with 3 Different Soft Tapping Mode AFM Cantilevers, Low Force Constant, Reflective Aluminum
AFM probes of the HQ:NSC36 series have three different tipless soft tapping mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The aluminum reflective coating enhances the laser reflectivity of the AFM cantilevers by approximately 2.5 times.
Reflective Aluminum
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AFM Probe Specifications
AFM Tip
| Shape |
|---|
| Tipless |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 1 N/m(0.1 - 4.6 N/m) | 90 kHz(30 - 160 kHz) | 110 µm(105 - 115µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
| Cantilever B | Beam | 2 N/m(0.2 - 9 N/m) | 130 kHz(45 - 240 kHz) | 90 µm(85 - 95µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
| Cantilever C | Beam | 0.6 N/m(0.06 - 2.7 N/m) | 65 kHz(25 - 115 kHz) | 130 µm(125 - 135µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
All typical values
HQ:CSC37/tipless/Al BS
Tipless AFM Probe with 3 Different Contact Mode AFM Cantilevers, Reflective Aluminum
AFM probes of the HQ:CSC37 series have three different tipless contact mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The aluminum reflective coating enhances the laser reflectivity of the AFM cantilevers by approximately 2.5 times.
Reflective Aluminum
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AFM Probe Specifications
AFM Tip
| Shape |
|---|
| Tipless |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 0.8 N/m(0.3 - 2 N/m) | 40 kHz(30 - 55 kHz) | 250 µm(245 - 255µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
| Cantilever B | Beam | 0.3 N/m(0.1 - 0.6 N/m) | 20 kHz(15 - 30 kHz) | 350 µm(345 - 355µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
| Cantilever C | Beam | 0.4 N/m(0.1 - 1 N/m) | 30 kHz(20 - 40 kHz) | 300 µm(295 - 305µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
All typical values
HQ:CSC38/tipless/Al BS
Tipless AFM Probe with 3 Different Contact Mode AFM Cantilevers, Low Force Constant, Reflective Aluminum
AFM probes of the HQ:CSC38 series have three different tipless soft contact mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The aluminum reflective coating enhances the laser reflectivity of the AFM cantilevers by approximately 2.5 times.
Reflective Aluminum
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AFM Probe Specifications
AFM Tip
| Shape |
|---|
| Tipless |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 0.09 N/m(0.01 - 0.36 N/m) | 20 kHz(8 - 32 kHz) | 250 µm(245 - 255µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
| Cantilever B | Beam | 0.03 N/m(0.003 - 0.13 N/m) | 10 kHz(5 - 17 kHz) | 350 µm(345 - 355µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
| Cantilever C | Beam | 0.05 N/m(0.005 - 0.21 N/m) | 14 kHz(6 - 23 kHz) | 300 µm(295 - 305µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
All typical values
Documentation
Documentation
