Tin on Carbon Resolution Test Specimens

Tin spheres on carbon a very useful for SEM, FESEM, FIB astigmatism correction due to their nearly perfect round shape. Tin on carbon is also used instead of gold on carbon where gold is not allowed in the SEM, FESEM or FIB, such as in semiconductor applications. The round tin spheres are particularly useful for testing image quality, distortion, contrast, brightness and probe size. Available in three versions for low, medium and high magnifications.

Tin Spheres on Carbon, Low Magnification

Size ranging from 1 -10µm for table top SEMs and low magnification testing of SEM, FESEM and FIB. Magnification range approximately 250 x - 5000x. Available unmounted or on a mount of your choice. 6.4mm dia. x 0.7mm.
See the PELCO® SEM Sample Stub Vacuum Desiccator to protect your test specimen when mounted on a tin stub.

See mount selections A-R

Tin on Carbon Disc, Medium Magnification

Dispersion of tin spheres, the majority being within the size range of 10nm to 100nm, on a carbon substrate that is ø6mm x 0.5mm. Ideal for astigmatism correction and resolution determination. Recommended for SEM, FESEM, and FIB in the semiconductor industry where gold on carbon cannot be tolerated. This standard is available unmounted or mounted on a specimen stub of your choice.

See mount selections A-R

Tin on Carbon on Grid, High Magnification

Tin dispersed on the surface of a carbon substrate supported by a 3mm tabbed copper slot grid (slot size 0.4 x 2mm), with a use range of around 3 - 60nm. Tin spheres are easy to locate on the side of the slot. The comparative thinness of the supporting grid allows for your specimen and the tin sphere standard to be a the same level. Available unmounted or mounted on a specimen stub of your choice.

See mount selections A-R

Tin on Carbon Disc, Wide Magnification Range

Dispersion of tin spheres on a carbon substrate that is 6.15mm diameter x 2.2mm thickness. Approximate size range of <20 - 400nm. Spherical shape ideal for astigmatism correction. Wide particle size range with larger spheres that are easier to use at low kV. Recommended for SEM, FESEM, and FIB in the semiconductor industry where gold on carbon cannot be tolerated. Available unmounted or mounted on a specimen stub of your choice.

See mount selections A-R