The Tap190-G series of AFM probes are characterized by a resonance frequency of 190kHz and have a longer cantilever compared to the TAP300 and TAP150-G AFM probes. This is required by some models of AFM systems by certain manufactureres, such as Quesant. This product is available with alignment grooves only
Technical Data:
Value
Range
Resonant Freq.
190 kHz
+/-60 kHz
Force Constant
48 N/m
20 - 100 N/m
Length
225 µm
+/-12 µm
Mean Width
38 µm
+/-9 µm
Thickness
7 µm
+/-1 µm
Tip Height
17 µm
+/-2 µm
Tip Set Back
15 µm
+/-5 µm
Tip Radius
<10 nm (Tap190-G, Tap190AL-G) <25nm (ElectriTap190) <15nm (Tap190DLC) Also see individual probes.
Half Cone Angle
20°-25° along cantilever axis 25°-30° from side 10°-at the apex
Tap190-GTip radius <10nm
Application:
Tapping Mode, Intermittent Contact Mode, long canitlever
General:
Rotated Monolithic Silicon Probe Symmetric Tip Shape Alignment Grooves (Chip size 3.4 x 1.6 x 0.3mm)
Coating:
None
Tap190AL-GTip radius <10nm
Application:
Tapping Mode, Intermittent Contact Mode, long cantilever
General:
Rotated Monolithic Silicon Probe Symmetric Tip Shape Alignment Grooves (Chip size 3.4 x 1.6 x 0.3mm)
Coating:
Aluminum Reflex coating, 30nm thick This probe uses an "on scan angle" symmetric tip to provide a more symmetric representation of features over 200nm
ElectriTap190Tip radius <25nm
Application:
Tapping Mode, Intermittent Contact Mode and Electric Modes like: • Scanning Capacitance Microscopy (SCM) • Electrostatic Force Microscopy (EFM) • Kelvin Probe Force Microscopy (KFM) • Scanning Probe Lithography
General:
Rotated Monolithic silicon probe Symmetric Tip Shape Alignment Grooves (Chip size 3.4 x 1.6 x 0.3mm)
Coating:
Electrically conductive Cr/Pt on both sides of cantilever. 5nm Cr covered with 25nm Pt.
Contact Resistance: 300 ohms on Pt thin film surface
Tap190DLCTip radius <15nm
Application:
Tapping Mode, Intermittent Contact Mode, long cantilever
General:
Rotated Monolithic Silicon Probe Symmetric Tip Shape Alignment Grooves (Chip size 3.4 x 1.6 x 0.3mm)
Coating:
Diamond-Like-Coating on tip side of cantilever, 15nm thick Aluminum Reflex coating on detector side of cantilever, 30nm thick This probe uses an "on scan angle" symmetric tip to provide a more symmetric representation of features over 200nm