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OPUS® Standard Tapping Mode AFM Tips
OPUS® Standard Tapping Mode AFM Tips
160AC-NN
OPUS® Standard Tapping Mode AFM Cantilever without Coating
AFM Probe Specifications:
Coating
Additional Info
AFM probes of the 160AC series are designed for standard tapping mode AFM imaging in air or vacuum.
The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.
The uncoated AFM probe offers a sharp AFM tip apex, chemical inertness and a high AFM cantilever Quality factor.
AFM Tip:
| Shape | Height | Setback | Radius | Half Cone Angle |
|---|---|---|---|---|
| Optimized Positioning | 14 µm (12 - 16 µm)* | 0 µm | < 7 nm | 0° front, 35° back, <9° side |
* typical values
AFM Cantilever:
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Standard tapping mode AFM cantilever | Beam | 26 N/m(8 - 57 N/m)* | 300 kHz(200 - 400 kHz)* | 160 µm(150 - 170µm)* | 40 µm(38 - 42µm)* | 4µm(3.5 - 4.5 µm)* |
* typical values
160AC-NA
OPUS® Standard Tapping Mode AFM Cantilever with Al Reflective Coating
AFM Probe Specifications:
Coating
Reflective Aluminum
Additional Info
AFM probes of the 160AC series are designed for standard tapping mode AFM imaging in air or vacuum.
The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.
The uncoated AFM tip offers a sharp AFM tip apex and chemical inertness. The back side aluminum coating significantly enhances the AFM cantilever reflectivity in air and vacuum. For operation in liquids we recommend using the 160AC-NG with a reflective gold coating.
AFM Tip:
| Shape | Height | Setback | Radius | Half Cone Angle |
|---|---|---|---|---|
| Optimized Positioning | 14 µm (12 - 16 µm)* | 0 µm | < 7 nm | 0° front, 35° back, <9° side |
* typical values
AFM Cantilever:
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Standard tapping mode AFM cantilever | Beam | 26 N/m(8 - 57 N/m)* | 300 kHz(200 - 400 kHz)* | 160 µm(150 - 170µm)* | 40 µm(38 - 42µm)* | 4µm(3.5 - 4.5 µm)* |
* typical values
160AC-NG
OPUS® Standard Tapping Mode AFM Cantilever with Au Reflective Coating
AFM Probe Specifications:
Coating
Reflective Gold
Additional Info
AFM probes of the 160AC series are designed primarily for standard tapping mode AFM imaging in air or vacuum.
The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.
The uncoated AFM tip offers a sharp AFM tip apex and chemical inertness. The back side gold coating ensures high and stable laser reflectivity in air, vacuum, liquid and aggressive chemical environments.
AFM Tip:
| Shape | Height | Setback | Radius | Half Cone Angle |
|---|---|---|---|---|
| Optimized Positioning | 14 µm (12 - 16 µm)* | 0 µm | < 7 nm | 0° front, 35° back, <9° side |
* typical values
AFM Cantilever:
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Standard tapping mode AFM cantilever | Beam | 26 N/m(8 - 57 N/m)* | 300 kHz(200 - 400 kHz)* | 160 µm(150 - 170µm)* | 40 µm(38 - 42µm)* | 4µm(3.5 - 4.5 µm)* |
* typical values
4XC-NN
OPUS® 4 AFM Cantilevers without Coating for Various Applications
AFM Probe Specifications:
Coating
none
Additional Info
AFM probes of the 4XC series feature four different AFM cantilevers for various measurement modes, two on each side of the holder chip:
- 500DC - Contact mode AFM cantilever
- 240AC - Soft tapping mode AFM cantilever for imaging soft samples
- 200AC - Standard tapping mode AFM cantilever
- 65AC - High resonance frequency AFM cantilever for High speed scanning
The uncoated AFM probe offers sharp AFM tip apexes, chemical inertness and high AFM cantilever Quality factors.
The tetrahedral AFM tips are located precisely at the free ends of the AFM cantilevers. This allows the AFM tips to be positioned accurately over the area of interest on the sample surface.
AFM Tip:
| Shape | Height | Setback | Radius | Half Cone Angle |
|---|---|---|---|---|
| Optimized Positioning | 14 µm (12 - 16 µm)* | 0 µm | < 7 nm | 0° front, 35° back, <9° side |
* typical values
AFM Cantilever:
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Contact mode AFM cantilever | Beam | 0.3 N/m(0.1 - 0.6 N/m)* | 17 kHz(11 - 22 kHz)* | 500 µm(485 - 515µm)* | 30 µm(28 - 32µm)* | 3µm(2.5 - 3.5 µm)* |
| Soft tapping mode AFM cantilever | Beam | 2.5 N/m(0.75 - 5.3 N/m)* | 75 kHz(50 - 100 kHz)* | 240 µm(225 - 255µm)* | 30 µm(28 - 32µm)* | 3µm(2.5 - 3.5 µm)* |
| Standard tapping mode AFM cantilever | Beam | 9 N/m(2.8 - 21 N/m)* | 150 kHz(100 - 200 kHz)* | 175 µm(160 - 190µm)* | 40 µm(38 - 42µm)* | 3µm(2.5 - 3.5 µm)* |
| High frequency tapping mode AFM cantilever | Beam | 100 N/m(35 - 215 N/m)* | 1200 kHz(650 - 1850 kHz)* | 65 µm(50 - 80µm)* | 31 µm(29 - 33µm)* | 3µm(2.5 - 3.5 µm)* |
* typical values
200AC-NA
OPUS® Standard Tapping Mode AFM Cantilever with Al Reflective Coating
AFM Probe Specifications:
Coating
Reflective Aluminum
Additional Info
AFM probes of the 200AC series are designed for tapping mode AFM imaging of standard and soft samples.
The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.
The uncoated AFM tip offers a sharp AFM tip apex and chemical inertness. The back side aluminum coating significantly enhances the AFM cantilever reflectivity in air and vacuum.
AFM Tip:
| Shape | Height | Setback | Radius | Half Cone Angle |
|---|---|---|---|---|
| Optimized Positioning | 14 µm (12 - 16 µm)* | 0 µm | < 7 nm | 0° front, 35° back, <9° side |
* typical values
AFM Cantilever:
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Standard tapping mode AFM cantilever | Beam | 9 N/m(3 - 22 N/m)* | 135 kHz(85 - 175 kHz)* | 200 µm(190 - 210µm)* | 40 µm(38 - 42µm)* | 3.5µm(3 - 4 µm)* |
* typical values
3XC-NA
OPUS® 3 AFM Cantilevers with Al Reflective Coating for Various Applications
AFM Probe Specifications:
Coating
Reflective Aluminum
Additional Info
AFM probes of the 3XC series feature three different AFM cantilevers for various measurement modes:
- 500DC - Contact mode AFM cantilever
- 240AC - Soft tapping mode AFM cantilever for imaging soft samples
- 200AC - Standard tapping mode AFM cantilever
The tetrahedral AFM tips are located precisely at the free ends of the AFM cantilevers. This allows the AFM tips to be positioned accurately over the area of interest on the sample surface.
The uncoated AFM tips offer sharp AFM tip apexes and chemical inertness. The back side aluminum coating significantly enhances the AFM cantilever reflectivity in air and vacuum. For operation in liquids we recommend using the 3XC-GG with an overall gold coating.
AFM Tip:
| Shape | Height | Setback | Radius | Half Cone Angle |
|---|---|---|---|---|
| Optimized Positioning | 14 µm (12 - 16 µm)* | 0 µm | < 7 nm | 0° front, 35° back, <9° side |
* typical values
AFM Cantilever:
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Contact mode AFM cantilever | Beam | 0.3 N/m(0.1 - 0.6 N/m)* | 17 kHz(11 - 22 kHz)* | 500 µm(490 - 510µm)* | 30 µm(28 - 32µm)* | 3µm(2.5 - 3.5 µm)* |
| Standard tapping mode AFM cantilever | Beam | 9 N/m(2.8 - 21 N/m)* | 150 kHz(100 - 200 kHz)* | 175 µm(165 - 185µm)* | 40 µm(38 - 42µm)* | 3µm(2.5 - 3.5 µm)* |
| Soft tapping mode AFM cantilever | Beam | 2.5 N/m(0.75 - 5.3 N/m)* | 75 kHz(50 - 100 kHz)* | 240 µm(230 - 250µm)* | 30 µm(28 - 32µm)* | 3µm(2.5 - 3.5 µm)* |
* typical values
3XC-NN
OPUS® 3 AFM Cantilevers without Coating for Various Applications
AFM Probe Specifications:
Coating
none
Additional Info
AFM probes of the 3XC series feature three different AFM cantilevers for various measurement modes:
- 500DC - Contact mode AFM cantilever
- 240AC - Soft tapping mode AFM cantilever for imaging soft samples
- 200AC - Standard tapping mode AFM cantilever
The tetrahedral AFM tips are located precisely at the free ends of the AFM cantilevers. This allows the AFM tips to be positioned accurately over the area of interest on the sample surface.
The uncoated AFM probe offers sharp AFM tip apexes, chemical inertness and high AFM cantilever Quality factors.
AFM Tip:
| Shape | Height | Setback | Radius | Half Cone Angle |
|---|---|---|---|---|
| Optimized Positioning | 14 µm (12 - 16 µm)* | 0 µm | < 7 nm | 0° front, 35° back, <9° side |
* typical values
AFM Cantilever:
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Contact mode AFM cantilever | Beam | 0.3 N/m(0.1 - 0.6 N/m)* | 17 kHz(11 - 22 kHz)* | 500 µm(490 - 510µm)* | 30 µm(28 - 32µm)* | 3µm(2.5 - 3.5 µm)* |
| Standard tapping mode AFM cantilever | Beam | 9 N/m(2.8 - 21 N/m)* | 150 kHz(100 - 200 kHz)* | 175 µm(165 - 185µm)* | 40 µm(38 - 42µm)* | 3µm(2.5 - 3.5 µm)* |
| Soft tapping mode AFM cantilever | Beam | 2.5 N/m(0.75 - 5.3 N/m)* | 75 kHz(50 - 100 kHz)* | 240 µm(230 - 250µm)* | 30 µm(28 - 32µm)* | 3µm(2.5 - 3.5 µm)* |
* typical values
OPUS AFM Probes: Optimized Positioning Upon Sample
Olympus replacement AFM probes
In September 2022 Olympus®* Corp. decided to discontinue all their Olympus®* AFM probes. OPUS AFM tips are identical to Olympus®* AFM tips in form, fit and function.
*Olympus® is a trademark of Olympus Corporation
Documentation
Documentation
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