Standard tapping mode AFM probes

Tap300-G

Tapping Mode AFM Probe

AFM Probe Specifications:

AFM Tip

Shape: Rotated

Height: 17 µm (15 - 19 µm)*

Setback: 15 µm (10 - 20 µm)*

Radius: < 10 nm

Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever

Cantilever A

Shape: Beam

Force Constant: 40 N/m (20 - 75 N/m)*

Resonance Frequency: 300 kHz (200 - 400 kHz)*

Length: 125 µm (115 - 135 µm)*

Width: 30 µm (25 - 35 µm)*

Thickness: 4 µm (3 - 5 µm)*

* typical range

Coating

Uncoated

Alignment Grooves

This product features alignment grooves on the back side of the holder chip.

Additional Info

Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation.

The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

For measurements in liquids please use the back side gold coated Tap300GD-G or the overall gold coated Tap300GB-G!

Consistent high quality at a lower price!

Tap300Al-G

Tapping Mode AFM Probe with Aluminum Reflective Coating

AFM Probe Specifications:

AFM Tip

Shape: Rotated

Height: 17 µm (15 - 19 µm)*

Setback: 15 µm (10 - 20 µm)*

Radius: < 10 nm

Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever

Cantilever A

Shape: Beam

Force Constant: 40 N/m (20 - 75 N/m)*

Resonance Frequency: 300 kHz (200 - 400 kHz)*

Length: 125 µm (115 - 135 µm)*

Width: 30 µm (25 - 35 µm)*

Thickness: 4 µm (3 - 5 µm)*

* typical range

Coating

Aluminium reflex coating on detector side of the cantilever, 30 nm thick

Alignment Grooves

This product features alignment grooves on the back side of the holder chip.

Additional Info

Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation.

The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

For measurements in liquids please use the back side gold coated Tap300GD-G or the overall gold coated Tap300GB-G!

Consistent high quality at a lower price!

Tap190-G

Tapping Mode AFM Probe with Long Cantilever

AFM Probe Specifications:

AFM Tip

Shape: Rotated

Height: 17 µm (15 - 19 µm)*

Setback: 15 µm (10 - 20 µm)*

Radius: < 10 nm

Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever

Cantilever A

Shape: Beam

Force Constant: 48 N/m (28 - 75 N/m)*

Resonance Frequency: 190 kHz (160 - 220 kHz)*

Length: 225 µm (215 - 235 µm)*

Width: 38 µm (33 - 43 µm)*

Thickness: 7 µm (6 - 8 µm)*

* typical range

Coating

Uncoated

Alignment Grooves

This product features alignment grooves on the back side of the holder chip.

Additional Info

Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation.

The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

BudgetSensors' Tap190-G features a longer AFM cantilever and it is meant as an alternative to BudgetSensors' Tap300 AFM probes series, when the feedback loop of the AFM system does not accept high frequencies (400 kHz) or when the detection system needs a minimum AFM cantilever length > 125 µm. The scanning speed of Tap190 series AFM probes is slightly slower than the scanning speed of the Tap300 series.

For measurements in liquids please use the back side gold coated Tap190GD-G or the overall gold coated Tap190GB-G!.

Tap190Al-G

Tapping Mode AFM Probe with Long Cantilever and Aluminum Reflective Coating

AFM Probe Specifications:

AFM Tip

Shape: Rotated

Height: 17 µm (15 - 19 µm)*

Setback: 15 µm (10 - 20 µm)*

Radius: < 10 nm

Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever

Cantilever A

Shape: Beam

Force Constant: 48 N/m (28 - 75 N/m)*

Resonance Frequency: 190 kHz (160 - 220 kHz)*

Length: 225 µm (215 - 235 µm)*

Width: 38 µm (33 - 43 µm)*

Thickness: 7 µm (6 - 8 µm)*

* typical range

Coating

Aluminium reflex coating on detector side of the cantilever, 30 nm thick

Alignment Grooves

This product features alignment grooves on the back side of the holder chip.

Additional Info

Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation.

The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

For measurements in liquids please use the back side gold coated Tap190GD-G or the overall gold coated Tap190GB-G!.

Tap300GD-G

Tapping Mode AFM Probe with Gold Reflective Coating

AFM Probe Specifications:

AFM Tip

Shape: Rotated

Height: 17 µm (15 - 19 µm)*

Setback: 15 µm (10 - 20 µm)*

Radius: < 10 nm

Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever

Cantilever A

Shape: Beam

Force Constant: 40 N/m (20 - 75 N/m)*

Resonance Frequency: 300 kHz (200 - 400 kHz)*

Length: 125 µm (115 - 135 µm)*

Width: 30 µm (25 - 35 µm)*

Thickness: 4 µm (3 - 5 µm)*

* typical range

Coating

Gold coating on detector side of the cantilever, 70 nm thick

Alignment Grooves

This product features alignment grooves on the back side of the holder chip.

Additional Info

Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation.

The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

Consistent high quality at a lower price!

Tap190GD-G

Tapping Mode AFM Probe with Long Cantilever and Gold Reflective Coating

AFM Probe Specifications:

AFM Tip

Shape: Rotated

Height: 17 µm (15 - 19 µm)*

Setback: 15 µm (10 - 20 µm)*

Radius: < 10 nm

Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever

Cantilever A

Shape: Beam

Force Constant: 48 N/m (28 - 75 N/m)*

Resonance Frequency: 190 kHz (160 - 220 kHz)*

Length: 225 µm (215 - 235 µm)*

Width: 38 µm (33 - 43 µm)*

Thickness: 7 µm (6 - 8 µm)*

* typical range

Coating

Gold coating on detector side of the cantilever, 70 nm thick

Alignment Grooves

This product features alignment grooves on the back side of the holder chip.

Additional Info

Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation.

The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

Consistent high quality at a lower price!

Documentation

SDS

Technical Notes

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Variant	Variant total	Quantity	Price	Variant total
TAP300-G AFM Probe for Tapping Mode, uncoated, alignment grooves (Unit: pkg/10)Tap300-G-10	TAP300-G AFM Probe for Tapping Mode, uncoated, alignment grooves (Unit: pkg/10)Tap300-G-10 1.101,44 lei/ea	0,00 lei	Quantity	1.101,44 lei/ea	0,00 lei

TAP300-G AFM Probe for Tapping Mode, uncoated, alignment grooves (Unit: pkg/50)Tap300-G-50	TAP300-G AFM Probe for Tapping Mode, uncoated, alignment grooves (Unit: pkg/50)Tap300-G-50 4.829,38 lei/ea	0,00 lei	Quantity	4.829,38 lei/ea	0,00 lei

TAP300-G AFM Probe for Tapping Mode, uncoated, alignment grooves (Unit: pkg/380)Tap300-G-380	TAP300-G AFM Probe for Tapping Mode, uncoated, alignment grooves (Unit: pkg/380)Tap300-G-380 25.417,80 lei/ea	0,00 lei	Quantity	25.417,80 lei/ea	0,00 lei

TAP300Al-G AFM Probe for Tapping Mode, Al reflex coating, alignment grooves (Unit: pkg/10)Tap300Al-G-10	TAP300Al-G AFM Probe for Tapping Mode, Al reflex coating, alignment grooves (Unit: pkg/10)Tap300Al-G-10 1.157,92 lei/ea	0,00 lei	Quantity	1.157,92 lei/ea	0,00 lei

TAP300Al-G AFM Probe for Tapping Mode, Al reflex coating, alignment grooves (Unit: pkg/50)Tap300Al-G-50	TAP300Al-G AFM Probe for Tapping Mode, Al reflex coating, alignment grooves (Unit: pkg/50)Tap300Al-G-50 5.055,32 lei/ea	0,00 lei	Quantity	5.055,32 lei/ea	0,00 lei

TAP300Al-G AFM Probe for Tapping Mode, Al reflex coating, alignment grooves (Unit: pkg/380)Tap300Al-G-380	TAP300Al-G AFM Probe for Tapping Mode, Al reflex coating, alignment grooves (Unit: pkg/380)Tap300Al-G-380 25.417,80 lei/ea	0,00 lei	Quantity	25.417,80 lei/ea	0,00 lei

TAP190-G AFM Probe for Tapping Mode with Long Cantilever, uncoated, alignment grooves (Unit: pkg/10)Tap190-G-10	TAP190-G AFM Probe for Tapping Mode with Long Cantilever, uncoated, alignment grooves (Unit: pkg/10)Tap190-G-10 1.101,44 lei/ea	0,00 lei	Quantity	1.101,44 lei/ea	0,00 lei

TAP190-G AFM Probe for Tapping Mode with Long Cantilever, uncoated, alignment grooves (Unit: pkg/50)Tap190-G-50	TAP190-G AFM Probe for Tapping Mode with Long Cantilever, uncoated, alignment grooves (Unit: pkg/50)Tap190-G-50 4.829,38 lei/ea	0,00 lei	Quantity	4.829,38 lei/ea	0,00 lei

TAP190-G AFM Probe for Tapping Mode with Long Cantilever, uncoated, alignment grooves (Unit: pkg/380)Tap190-G-380	TAP190-G AFM Probe for Tapping Mode with Long Cantilever, uncoated, alignment grooves (Unit: pkg/380)Tap190-G-380 25.417,80 lei/ea	0,00 lei	Quantity	25.417,80 lei/ea	0,00 lei

TAP190Al-G AFM Probe for Tapping Mode with Long Cantilever, Al reflex coating, alignment grooves (Unit: pkg/10)Tap190Al-G-10	TAP190Al-G AFM Probe for Tapping Mode with Long Cantilever, Al reflex coating, alignment grooves (Unit: pkg/10)Tap190Al-G-10 1.157,92 lei/ea	0,00 lei	Quantity	1.157,92 lei/ea	0,00 lei

TAP190Al-G AFM Probe for Tapping Mode with Long Cantilever, Al reflex coating, alignment grooves (Unit: pkg/50)Tap190Al-G-50	TAP190Al-G AFM Probe for Tapping Mode with Long Cantilever, Al reflex coating, alignment grooves (Unit: pkg/50)Tap190Al-G-50 5.055,32 lei/ea	0,00 lei	Quantity	5.055,32 lei/ea	0,00 lei

TAP190Al-G AFM Probe for Tapping Mode with Long Cantilever, Al reflex coating, alignment grooves (Unit: pkg/380)Tap190Al-G-380	TAP190Al-G AFM Probe for Tapping Mode with Long Cantilever, Al reflex coating, alignment grooves (Unit: pkg/380)Tap190Al-G-380 25.417,80 lei/ea	0,00 lei	Quantity	25.417,80 lei/ea	0,00 lei

TAP300GD-G AFM Probe for Tapping Mode, Au reflex coating, alignment grooves (Unit: pkg/10)Tap300GD-G-10	TAP300GD-G AFM Probe for Tapping Mode, Au reflex coating, alignment grooves (Unit: pkg/10)Tap300GD-G-10 1.468,58 lei/ea	0,00 lei	Quantity	1.468,58 lei/ea	0,00 lei

TAP300GD-G AFM Probe for Tapping Mode, Au reflex coating, alignment grooves (Unit: pkg/50)Tap300GD-G-50	TAP300GD-G AFM Probe for Tapping Mode, Au reflex coating, alignment grooves (Unit: pkg/50)Tap300GD-G-50 6.100,27 lei/ea	0,00 lei	Quantity	6.100,27 lei/ea	0,00 lei

TAP190GD-G AFM Probe for Tapping Mode with Long Cantilever, Au reflex coating, alignment grooves (Unit: pkg/10)Tap190GD-G-10	TAP190GD-G AFM Probe for Tapping Mode with Long Cantilever, Au reflex coating, alignment grooves (Unit: pkg/10)Tap190GD-G-10 1.468,58 lei/ea	0,00 lei	Quantity	1.468,58 lei/ea	0,00 lei

TAP190GD-G AFM Probe for Tapping Mode with Long Cantilever, Au reflex coating, alignment grooves (Unit: pkg/50)Tap190GD-G-50	TAP190GD-G AFM Probe for Tapping Mode with Long Cantilever, Au reflex coating, alignment grooves (Unit: pkg/50)Tap190GD-G-50 6.100,27 lei/ea	0,00 lei	Quantity	6.100,27 lei/ea	0,00 lei

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Standard tapping mode AFM probes