Silicon Nitride AFM Probes
Silicon Nitride AFM Probes
Silicon Nitride Holder Chip
The Silicon Nitride Holder Chip fits most commercial AFMs as it is industry standard size. It is compatible with VEECO AFMs, TM Microscopes, JEOL, Molecular Imaging and other commercial AFMs.
Silicon Nitride Cantilever
SiN (Si3N4) probes feature 4 cantilevers per chip. The cantilever's low force constants make these probes ideal for very soft contact mode imaging.
Silicon Nitride Tip
The oxide-sharpened wedge tip has two peaks per tip, a "twin tip". The protrusion at the cantilever's end is used for imaging, since the cantilever is mounted at some angle (e.g. 13 deg.) which keeps only one tip interacting with the surface if the sample is sufficiently flat. (Valleys are not greater than 400nm deep).
| Technical Data: | |||
| Values: | short cantilever | long cantilever | Range |
| Resonant Freq. | 45 kHz | 12.6 kHz | - |
| Force Constant | 0.27 N/m | 0.06 N/m | - |
| Lengths | 100 µm | 200 µm | +/-10 µm |
| Widths | 16 µm | 30 µm | +/-5 µm |
| Thickness | 520 nm | +/-50 µm | |
| Tip Height (Wedge Tip) |
12 µm (overall) >450 nm (effective) |
+/-2 µm 450-550 nm |
|
| Double Tip Spacing | 4.5 µm | +/-0.5 µm | |
| Tip Radius | <15 nm | ||
| Half Cone Angle | 35° (macroscopic) | ||
| Reflex Coating | Gold/Chromium | ||
| Cantilever Bending | typically 3°, max 7° | ||
| Tip radius: | <15nm |
| Application: | Soft Contact Mode |
| General: | 4 Silicon Nitride Cantilevers (Triangular, 2 different lengths) Silicon Nitride Wedge Tip Silicon Support Chip (3.4 mm x 1.6 mm x 0.45 mm) |
| Cantilever lengths: | 100 µm and 200 µm |
| Coating: | 70 nm thick Chromium/Gold |
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