ScanAsyst®* AFM Probes

SelfAdjust-Air AFM cantilever close-up

SelfAdjust-Air AFM tip close-up

Typical AFM tip radius
2nm
Maximum AFM tip radius
8nm
Full cone angle
40°
Total AFM tip height
Nom: 5µm
Range: 4-7µm
Effective AFM tip height
Nom: 2.5µm
Range: 2-3.5µm
AFM tip material
n-type silicon
AFM cantilever material
Silicon-based amorphous thin layer
Detector coating
Aluminum

The SelfAdjust-Air AFM cantilevers feature finely tuned properties, optimal for ScanAsyst®* mode operation.

The silicon AFM tips have trihedral shape and the sharpest silicon apexes in our entire product range with typical radius of curvature 2nm and maximum radius of curvature below 8nm. The full AFM tip cone angle is 40° and even lower at the last 200nm near the AFM tip apex.

The aluminum reflective coating enhances the laser reflectivity of the AFM cantilever by approximately 2.5 times.

We recommend using SelfAdjust-Air AFM tips for measurements in ScanAsyst® PeakForce Tapping™* mode. Alternatively, the soft tapping mode HQ:NSC19/Al BS AFM tips can be used and some customers even prefer them for measurements in ScanAsyst®* mode. However, SelfAdjust-Air have been designed specifically for ScanAsyst® PeakForce Tapping™* mode application and are therefore the preferred choice. For more information on the HQ series soft tapping mode AFM tips check here .

1-AFM Cantilevers Series

AFM Cantilever	Resonance Frequency, kHz			Force Constant, N/m
AFM Cantilever	min	typical	max	min	typical	max
SelfAdjust-Air	50	70	90	0.25	0.4	0.75
HQ:NSC19/Al BS	25	65	120	0.05	0.5	2.3

Application

SelfAdjust-Air AFM tips can be used for imaging both hard samples and soft biological samples in ScanAsyst® PeakForce Tapping™* mode. The low interaction force allows preserving both the AFM tip and the sample, allowing very high resolution scans.

Bruker’s Tip Qualification module is used to assess the sharpness of a SelfAdjust-Air AFM tip based on a scan of the MikroMasch® PA01 AFM tip evaluation sample.

SEBS-BH 2 µm AFM Images - MikroMasch® NSC19 Series and SelfAdjust-Air AFM Probes

OSC-Elastomer Blend 40 µm AFM Images – MikroMasch® SelfAdjust-Air AFM Probes

OSC-Elastomer Blend 1.5 µm AFM Images after nanomachining – MikroMasch® SelfAdjust-Air AFM Probes

OSC-Elastomer Blend 1.5 µm AFM Images after nanomachining – MikroMasch® SelfAdjust-Air AFM Probes

SelfAdjust-Air

AFM probe for ScanAsyst* mode in air

SelfAdjust-Air AFM probes are specifically designed for Bruker's ScanAsyst®* mode. The AFM cantilevers’ properties, in particular force constant and Q-factor are such that the ScanAsyst®* self-optimization algorithm is optimally supported. Bruker’s PeakForce Tapping™* mode controls and minimizes the interaction forces so precisely that the SelfAdjust-Air AFM typical tip radius of only 2nm and maximum 8nm (the sharpest silicon AFM tip in our product range!) is maintained over an extremely long period of time.

SelfAdjust-Air AFM probes are perfectly suited for high-resolution imaging on solid surfaces and biological samples, as well as for everyday purposes for all AFM users looking for an easy-to-use AFM probe for Bruker's ScanAsyst®* mode with an outstanding lifetime.

Coating

Reflective Aluminum

AFM Probe Specifications

AFM Tip

Shape	Height	EFF Height	Full Cone Angle	Radius
Rotated	5 µm (4 - 7 µm)	2.5 µm (2 - 3.5 µm)	40°	< 2 nm

AFM Cantilever

Cantilever	Shape	Force Const.	Res. Freq.	Length	Width	Thickness
Cantilever A	Beam	0.4 N/m(0.25 - 0.75 N/m)	70 kHz(50 - 90 kHz)	100 µm(90 - 110µm)	25 µm(23 - 27µm)	0.95 µm(0.9 - 1 µm)

All typical values

HQ:NSC19/Al BS (click to link)

Soft Tapping Mode and LFM AFM Probe

Hi'Res-C19/Cr-Au

High Resolution, Soft Tapping Mode AFM Probe

The high-resolution AFM probes of the Hi'Res-C series feature a hydrophobic diamond-like spike at the apex of the silicon etched AFM tip.

AFM probes of the HQ:NSC19 series combine relatively high resonance frequency and low force constant, which makes them suitable for imaging soft and fragile surfaces at relatively high speeds in Soft tapping mode. They are compatible with Bruker ScanAsyst® PeakForce Tapping™*.

The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.

The overall 30 nm Au coating with 20 nm Cr sublayer is chemically inert. It also ehnances the laser reflectivity of the AFM cantilever in air and liquids. The coating does not cover the spike.

Coating

Reflective Gold