AFM tip evaluation sample with sharp pyramidal structures

AFM image of the PA01 surface. Scan taken with OPUS 240AC-NA probe with tip. Scan size 1µm, scan height 95nm.

The exact shape of the AFM probe tip is very important for obtaining AFM images of high quality and accuracy. As new AFM tips with nanometer radii of curvature become widespread, periodic structures that have surface features of similar or greater sharpness should be used to estimate the parameters of the AFM tip.

An AFM image of the PA01 structures is shown above. The AFM image is obtained using an OPUS.