Reflective Gold
OPUS® Ultrasharp AFM Tips
OPUS® Ultrasharp AFM Tips
160AC-SG
OPUS® High Resolution Standard Tapping Mode AFM Cantilever with Au Reflective Coating
AFM Probe Specifications:
Coating
Additional Info
The 160AC-SG AFMM probes with sharp diamond-like spikes are designed for high resolution tapping mode AFM imaging.
The terahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.
The gold coating ensures high and stable laser reflectivity in air, vacuum and liquids. Please note that while the tetrahedral AFM tip and the AFM tip side of the AFM cantilever are gold coated, the diamond-like spike remains uncoated.
AFM Tip:
| Shape | Height | Setback | Radius |
|---|---|---|---|
| Supersharp, Optimized Positioning | 14 µm (12 - 16 µm)* | 0 µm | < 1 nm |
* typical values
AFM Cantilever:
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| High resolution tapping mode AFM cantilever | Beam | 26 N/m(8 - 57 N/m)* | 300 kHz(200 - 400 kHz)* | 160 µm(150 - 170µm)* | 40 µm(38 - 42µm)* | 4µm(3.5 - 4.5 µm)* |
* typical values
240AC-SG
OPUS® High Resolution Soft Tapping Mode AFM Cantilever with Au Reflective Coating
AFM Probe Specifications:
Coating
Reflective Gold
Additional Info
The 240AC-SG AFM probes with sharp diamond-like spikes are designed for high resolution tapping mode AFM imaging of soft samples.
The terahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.
The gold coating ensures high and stable laser reflectivity in air, vacuum and liquids. Please note that while the tetrahedral AFM tip and the AFM tip side of the AFM cantilever are gold coated, the diamond-like spike remains uncoated.
AFM Tip:
| Shape | Height | Setback | Radius |
|---|---|---|---|
| Supersharp, Optimized Positioning | 14 µm (12 - 16 µm)* | 0 µm | < 1 nm |
* typical values
AFM Cantilever:
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| High resolution soft tapping mode AFM cantilever | Beam | 2 N/m(0.6 - 3.9 N/m)* | 70 kHz(45 - 90 kHz)* | 240 µm(230 - 250µm)* | 40 µm(38 - 42µm)* | 2.6µm(2.1 - 3.1 µm)* |
* typical values
OPUS AFM Probes: Optimized Positioning Upon Sample
Olympus replacement AFM probes
In September 2022 Olympus®* Corp. decided to discontinue all their Olympus®* AFM probes. OPUS AFM tips are identical to Olympus®* AFM tips in form, fit and function.
*Olympus® is a trademark of Olympus Corporation
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