OPUS® High Speed Scanning AFM Tips
OPUS® High Speed Scanning AFM Tips
55AC-NA
OPUS® High Frequency Tapping Mode AFM Cantilever with Al Reflective Coating
AFM Probe Specifications:
Reflective Aluminum
AFM probes of the 55AC series are designed for high speed AFM imaging.
The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.
The uncoated AFM tip offers a sharp AFM tip apex and chemical inertness. The back side aluminum coating significantly enhances the AFM cantilever reflectivity in air and vacuum. For operation in liquids we recommend using the 55AC-NG with a reflective gold coating.
AFM Tip:
| Shape | Height | Setback | Radius | Half Cone Angle |
|---|---|---|---|---|
| Optimized Positioning | 14 µm (12 - 16 µm)* | 0 µm | < 7 nm | 0° front, 35° back, <9° side |
* typical values
AFM Cantilever:
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| High frequency tapping mode AFM cantilever | Beam | 85 N/m(35 - 215 N/m)* | 1200 kHz(650 - 1850 kHz)* | 65 µm(55 - 75µm)* | 31 µm(29 - 33µm)* | 2.9µm(2.4 - 3.4 µm)* |
* typical values
55AC-NN
OPUS® High Frequency Tapping Mode AFM Cantilever without Coating
AFM Probe Specifications:
none
AFM probes of the 55AC series are designed for high speed AFM imaging.
The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.
The uncoated AFM probe offers a sharp AFM tip apex, chemical inertness and a high AFM cantilever Quality factor.
AFM Tip:
| Shape | Height | Setback | Radius | Half Cone Angle |
|---|---|---|---|---|
| Optimized Positioning | 14 µm (12 - 16 µm)* | 0 µm | < 7 nm | 0° front, 35° back, <9° side |
* typical values
AFM Cantilever:
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| High frequency tapping mode AFM cantilever | Beam | 85 N/m(35 - 215 N/m)* | 1200 kHz(650 - 1850 kHz)* | 65 µm(55 - 75µm)* | 31 µm(29 - 33µm)* | 2.9µm(2.4 - 3.4 µm)* |
* typical values
55AC-NG
OPUS® High Frequency Tapping Mode AFM Cantilever with Au Reflective Coating
AFM Probe Specifications:
Reflective Gold
AFM probes of the 55AC series are designed for high speed AFM imaging.
The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.
The uncoated AFM tip offers a sharp AFM tip apex and chemical inertness. The back side gold coating ensures high and stable laser reflectivity in air, vacuum, liquid and aggressive chemical environments.
AFM Tip:
| Shape | Height | Setback | Radius | Half Cone Angle |
|---|---|---|---|---|
| Optimized Positioning | 14 µm (12 - 16 µm)* | 0 µm | < 7 nm | 0° front, 35° back, <9° side |
* typical values
AFM Cantilever:
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| High frequency tapping mode AFM cantilever | Beam | 85 N/m(35 - 215 N/m)* | 1200 kHz(650 - 1850 kHz)* | 65 µm(55 - 75µm)* | 31 µm(29 - 33µm)* | 2.9µm(2.4 - 3.4 µm)* |
* typical values
OPUS AFM Probes: Optimized Positioning Upon Sample
Olympus replacement AFM probes
In September 2022 Olympus®* Corp. decided to discontinue all their Olympus®* AFM probes. OPUS AFM tips are identical to Olympus®* AFM tips in form, fit and function.
*Olympus® is a trademark of Olympus Corporation
Documentation
Documentation
🚚 Estimated Delivery: 5 - 6 weeks from payment confirmation
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