Electrically Conductive
OPUS® Conductive AFM Tips
OPUS® Conductive AFM Tips
240AC-PP
OPUS® Soft Tapping Mode AFM Cantilever with Pt Overall Coating
AFM Probe Specifications:
Coating
Additional Info
The 240AC-PP AFM probes are designed for tapping mode electrical characterization measurements such as Electrostatic Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), etc.
The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.
The overall platinum coating ensures high electrical conductivity and significantly enhances the AFM cantilever reflectivity.
AFM Tip:
| Shape | Height | Setback | Radius | Half Cone Angle |
|---|---|---|---|---|
| Optimized Positioning | 14 µm (12 - 16 µm)* | 0 µm | < 25 nm | 0° front, 35° back, <9° side |
* typical values
AFM Cantilever:
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Soft tapping mode AFM cantilever | Beam | 2 N/m(0.6 - 3.9 N/m)* | 70 kHz(45 - 90 kHz)* | 240 µm(230 - 250µm)* | 40 µm(38 - 42µm)* | 2.6µm(2.1 - 3.1 µm)* |
* typical values
OPUS AFM Probes: Optimized Positioning Upon Sample
Olympus replacement AFM probes
In September 2022 Olympus®* Corp. decided to discontinue all their Olympus®* AFM probes. OPUS AFM tips are identical to Olympus®* AFM tips in form, fit and function.
*Olympus® is a trademark of Olympus Corporation
Documentation
Documentation
🚚 Estimated Delivery: 5 - 6 weeks from payment confirmation
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