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    Multi75 series for force modulation mode
Multi75 series for force modulation mode
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| Multi75-G Tip radius <10nm | |
| Application: | Force Modulation, Light Tapping | 
| General: | Rotated Monolithic Silicon Probe Symmetric Tip Shape Alignment Grooves (Chipsize 3.4 x 1.6 x 0.3mm)  | 
| Coating: | None | 

| Multi75Al Tip radius <10nm | |
| Application: | Force Modulation, Light Tapping | 
| General: | 
 Rotated Monolithic Silicon Probe  | 
| Coating: | 30nm Al for enhanced reflectivity | 

| Multi75GD Tip radius <10nm | |
| Application: | Force Modulation, Light Tapping | 
| General: | Rotated Monolithic Silicon Probe Symmetric Tip Shape (Chipsize 3.4 x 1.6 x 0.3mm)  | 
| Coating: | 70nm Au on back of cantilever | 

| Multi75GB Tip radius <25nm | |
| Application: | Force Modulation, Light Tapping, special application | 
| General: | Rotated Monolithic Silicon Probe Symmetric Tip Shape Alignment Grooves (Chipsize 3.4 x 1.6 x 0.3mm)  | 
| Coating: | 70nm Au on both sides of cantilever | 

| ElectriMulti75-G Tip radius <25nm | |
| Application: | Force Modulation, Light Tapping and Electric Modes like: • Scanning Capacitance Microscopy (SCM) • Electrostatic Force Microscopy (EFM) • Kelvin Probe Force Microscopy (KFM) • Scanning Probe lithography  | 
| General: | Rotated Monolithic Silicon Probe Symmetric Tip Shape Alignment Grooves (Chip size 3.4 x 1.6 x 0.3mm)  | 
| Coating: | Electrically conductive Cr/Pt on both sides of cantilever. 5nm Cr covered with 25nm Pt. | 
Contact Resistance: 300 ohms on Pt thin film surface

| MagneticMulti75 Tip radius <60nm | |
| Application: | Magnetic Force Microscopy (MFM) | 
| General: | 
 Rotated Monolithic Silicon Probe  | 
| Coating: | Tip side - Magnetic Detector side - Aluminum  | 

| Multi75DLC Tip radius <15nm | |
| Application: | Force Modulation Mode, Pulsed Force Mode (PFM) | 
| General: | Rotated Monolithic Silicon Probe Symmetric Tip Shape Alignment Grooves (Chipsize 3.4 x 1.6 x 0.3mm)  | 
| Coating: | Diamond-Like-Coating on tip side of cantilever, 15nm thick Aluminum Reflex coating on detector side of cantilever, 30nm thick This probe uses an "on scan angle" symmetric tip to provide a more symmetric representation of features over 200nm.  | 
                      
                        
                        
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