Life Science / Bio AFM Probes
Life Science / Bio AFM Probes

Uncoated silicon HQ AFM tip close-up

Cr-Au coated silicon HQ AFM tip close-up
Typical radius of uncoated AFM tip
8nm
Resulting AFM tip radius with the coating
<35nm
Full AFM tip cone angle
40°
Total AFM tip height
12-18µm
AFM probe material
n-type silicon
AFM tip coating
Uncoated or gold
Detector coating
Gold
Gold is chemically inert and hydrophobic, which makes gold coated AFM probes suitable for many experiments in biology and chemistry. Gold coated AFM probes are also used in certain electrical applications.
The coating is deposited on the back side of the AFM cantilever only (Cr-Au models) or on both sides of the AFM cantilever (Cr-Au BS models). The Cr-Au coating is formed as a 30nm Au film with a 20nm Cr sublayer, which is deposited for better adhesion of Au. The coating may cause AFM cantilever bending <3°.
The HQ:NSC and HQ:CSC AFM tips have trihedral shape with a full cone angle of 40° and even smaller at the last 200nm of the AFM tip apex.
1 AFM Cantilever Series

| AFM Cantilever | Resonance Frequency, kHz | Force Constant, N/m | ||||
|---|---|---|---|---|---|---|
| min | typical | max | min | typical | max | |
| 14 series | 110 | 160 | 220 | 1.8 | 5.0 | 13 |
| 15 series | 265 | 325 | 410 | 20 | 40 | 80 |
| 16 series | 170 | 190 | 210 | 30 | 45 | 70 |
| 17 series | 10 | 13 | 17 | 0.06 | 0.18 | 0.40 |
| 18 series | 60 | 75 | 90 | 1.2 | 2.8 | 5.5 |
| 19 series | 25 | 65 | 120 | 0.05 | 0.5 | 2.3 |
3 AFM Cantilevers Series


| AFM Cantilever | Resonance Frequency, kHz | Force Constant, N/m | |||||
|---|---|---|---|---|---|---|---|
| min | typical | max | min | typical | max | ||
| 35 series | Cantilever A | 130 | 205 | 290 | 2.7 | 8.9 | 24 |
| Cantilever B | 185 | 300 | 430 | 4.8 | 16 | 44 | |
| Cantilever C | 95 | 150 | 205 | 1.7 | 5.4 | 14 | |
| 36 series | Cantilever A | 30 | 90 | 160 | 0.1 | 1.0 | 4.6 |
| Cantilever B | 45 | 130 | 240 | 0.2 | 2 | 9 | |
| Cantilever C | 25 | 65 | 115 | 0.06 | 0.6 | 2.7 | |
| 37 series | Cantilever A | 30 | 40 | 55 | 0.3 | 0.8 | 2 |
| Cantilever B | 15 | 20 | 30 | 0.1 | 0.3 | 0.6 | |
| Cantilever C | 20 | 30 | 40 | 0.1 | 0.4 | 1 | |
| 38 series | Cantilever A | 8 | 20 | 32 | 0.01 | 0.09 | 0.36 |
| Cantilever B | 5 | 10 | 17 | 0.003 | 0.03 | 0.13 | |
| Cantilever C | 6 | 14 | 23 | 0.005 | 0.05 | 0.21 | |
HQ:NSC14/Cr-Au BS
Gold Coated Soft Tapping Mode AFM Probe
AFM probes of the HQ:NSC14 series are generally used in tapping mode for imaging relatively soft samples to obtain better phase contrast and reduce surface deformations caused by the tapping AFM tip.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The gold reflective coating enhances the laser reflectivity of the AFM cantilever in air and liquids.
Reflective Gold
![]()



AFM Probe Specifications
AFM Tip
| Shape | Full Cone Angle | Radius |
|---|---|---|
| Rotated | 40° | < 8 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 5 N/m(1.8 - 13 N/m) | 160 kHz(110 - 220 kHz) | 125 µm(120 - 130µm) | 25 µm(22 - 28µm) | 2.1 µm(1.6 - 2.6 µm) |
All typical values
HQ:NSC18/Cr-Au BS
Gold Coated Soft Tapping and Lift Mode AFM Probe
AFM probes of the HQ:NSC18 series are suitable for soft tapping and Lift mode operation AFM (e.g. EFM and MFM) since they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These AFM probes are also used for mapping of materials properties in Force modulation mode and true topography imaging of soft samples in Soft tapping mode.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The gold reflective coating enhances the laser reflectivity of the AFM cantilever in air and liquids.
Reflective Gold
![]()



AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 8 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 2.8 N/m(1.2 - 5.5 N/m) | 75 kHz(60 - 90 kHz) | 225 µm(220 - 230µm) | 27.5 µm(24.5 - 30.5µm) | 3 µm(2.5 - 3.5 µm) |
All typical values
XNC12/Cr-Au BS
AFM Probe with Gold Coated Silicon Nitride AFM Cantilevers
AFM probes of the XNC12 series have 2 silicon nitride AFM cantilevers and AFM tips on a glass holder chip. They are used for soft contact mode applications.
The gold reflective coating enhances the laser reflectivity of the AFM cantilevers.
Reflective Gold
![]()



AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Pyramid | 3.5 µm | 40° | < 10 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Triangle | 0.08 N/m | 17 kHz | 200 µm(190 - 210µm) | 28 µm(23 - 33µm) | 500 nm(425 - 575 nm) |
| Cantilever B | Triangle | 0.32 N/m | 67 kHz | 100 µm(90 - 110µm) | 13.5 µm(8.5 - 18.5µm) | 500 nm(425 - 575 nm) |
All typical values
HQ:NSC35/Cr-Au BS
AFM Probe with 3 Different Gold Coated Soft Tapping Mode AFM Cantilevers
AFM probes of the HQ:NSC35 series have three different soft tapping mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The gold reflective coating enhances the laser reflectivity of the AFM cantilevers in air and liquids.
Reflective Gold
![]()



AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 8 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 8.9 N/m(2.7 - 24 N/m) | 205 kHz(130 - 290 kHz) | 110 µm(105 - 115µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
| Cantilever B | Beam | 16 N/m(4.8 - 44 N/m) | 300 kHz(185 - 430 kHz) | 90 µm(85 - 95µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
| Cantilever C | Beam | 5.4 N/m(1.7 - 14 N/m) | 150 kHz(95 - 205 kHz) | 130 µm(125 - 135µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
All typical values
HQ:NSC36/Cr-Au BS
AFM Probe with 3 Different Gold Coated Soft Tapping Mode AFM Cantilevers, Low Force Constant
AFM probes of the HQ:NSC36 series have three different soft tapping mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The gold reflective coating enhances the laser reflectivity of the AFM cantilevers in air and liquids.
Reflective Gold
![]()



AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 8 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 1 N/m(0.1 - 4.6 N/m) | 90 kHz(30 - 160 kHz) | 110 µm(105 - 115µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
| Cantilever B | Beam | 2 N/m(0.2 - 9 N/m) | 130 kHz(45 - 240 kHz) | 90 µm(85 - 95µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
| Cantilever C | Beam | 0.6 N/m(0.06 - 2.7 N/m) | 65 kHz(25 - 115 kHz) | 130 µm(125 - 135µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
All typical values
HQ:NSC15/Cr-Au BS
Gold Coated Tapping Mode AFM Probe
AFM probes of the HQ:NSC15 series are generally used in tapping mode for imaging hard samples when high topographic and phase contrast are necessary. These AFM probes are also suitable for non-contact mode.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The gold reflective coating enhances the laser reflectivity of the AFM cantilever in air and liquids.
Reflective Gold
![]()



AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 8 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 40 N/m(20 - 80 N/m) | 325 kHz(265 - 410 kHz) | 125 µm(120 - 130µm) | 30 µm(27 - 33µm) | 4 µm(3.5 - 4.5 µm) |
All typical values
HQ:NSC16/Cr-Au BS
Gold Coated Tapping Mode AFM Probe with Long AFM Cantilever
AFM probes of the HQ:NSC16 series have AFM cantilevers with a high spring constant and low resonance frequency (below 250 kHz) that can be used in tapping mode in SPMs with low-frequency feedback loops. These AFM probes also fit SPM systems that do not support short AFM cantilever arms.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The gold reflective coating enhances the laser reflectivity of the AFM cantilever in air and liquids.
Reflective Gold
![]()



AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 8 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 45 N/m(30 - 70 N/m) | 190 kHz(170 - 210 kHz) | 225 µm(220 - 230µm) | 37.5 µm(34.5 - 40.5µm) | 7 µm(6.5 - 7.5 µm) |
All typical values
HQ:CSC17/Cr-Au BS
Gold Coated Contact Mode AFM Probe, Low Force Constant
AFM probes of the HQ:CSC17 series have AFM cantilevers with low force constants that offer high sensitivity in contact mode AFM. These AFM probes are also used for Lateral Force Microscopy.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The gold reflective coating enhances the laser reflectivity of the AFM cantilever in air and liquids.
Reflective Gold


AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 8 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 0.18 N/m(0.06 - 0.4 N/m) | 13 kHz(10 - 17 kHz) | 450 µm(445 - 455µm) | 50 µm(47 - 53µm) | 2 µm(1.5 - 2.5 µm) |
All typical values
HQ:NSC18/Cr-Au
Gold Coated Soft Tapping and Lift Mode AFM Probe, Gold Overall
AFM probes of the HQ:NSC18 series are suitable for soft tapping and Lift mode operation AFM (e.g. EFM and MFM) since they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These AFM probes are also used for mapping of materials properties in Force modulation mode and true topography imaging of soft samples in Soft tapping mode.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm Au coating with 20 nm Cr sublayer is electrically conductive and chemically inert. It also ehnances the laser reflectivity of the AFM cantilever in air and liquids. The resulting coated AFM tip radius is below 35 nm. The coating may cause AFM cantilever bending up to 3°.
Gold Overall
![]()



AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 35 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 2.8 N/m(1.2 - 5.5 N/m) | 75 kHz(60 - 90 kHz) | 225 µm(220 - 230µm) | 27.5 µm(24.5 - 30.5µm) | 3 µm(2.5 - 3.5 µm) |
All typical values
HQ:NSC19/Cr-Au
Gold Coated Soft Tapping Mode and LFM AFM Probe, Gold Overall
AFM probes of the HQ:NSC19 series combine relatively high resonance frequency and low force constant, which makes them suitable for imaging soft and fragile surfaces at relatively high speeds in Soft tapping mode. They are compatible with Bruker ScanAsyst® PeakForce Tapping™*. These AFM probes are also used in Lateral force microscopy due to their high sensitivity to lateral forces.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm Au coating with 20 nm Cr sublayer is electrically conductive and chemically inert. It also ehnances the laser reflectivity of the AFM cantilever in air and liquids. The resulting coated AFM tip radius is below 35 nm. The coating may cause AFM cantilever bending up to 3°.
Gold Overall
![]()



AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 35 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 0.5 N/m(0.05 - 2.3 N/m) | 65 kHz(25 - 120 kHz) | 125 µm(120 - 130µm) | 22.5 µm(19.5 - 25.5µm) | 1 µm(0.5 - 1.5 µm) |
All typical values
HQ:NSC35/Cr-Au
AFM Probe with 3 Different Gold Coated Soft Tapping Mode AFM Cantilevers, Gold Overall
AFM probes of the HQ:NSC35 series have three different soft tapping mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm Au coating with 20 nm Cr sublayer is electrically conductive and chemically inert. It also enhances the laser reflectivity of the AFM cantilevers in air and liquids. The resulting coated AFM tip radius is below 35 nm. The coating may cause AFM cantilever bending up to 3°.
Gold Overall
![]()



AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 35 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 8.9 N/m(2.7 - 24 N/m) | 205 kHz(130 - 290 kHz) | 110 µm(105 - 115µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
| Cantilever B | Beam | 16 N/m(4.8 - 44 N/m) | 300 kHz(185 - 430 kHz) | 90 µm(85 - 95µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
| Cantilever C | Beam | 5.4 N/m(1.7 - 14 N/m) | 150 kHz(95 - 205 kHz) | 130 µm(125 - 135µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
All typical values
HQ:NSC36/Cr-Au
AFM Probe with 3 Different Gold Coated Soft Tapping Mode AFM Cantilevers, Low Force Constant, Gold Overall
AFM probes of the HQ:NSC36 series have three different soft tapping mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm Au coating with 20 nm Cr sublayer is electrically conductive and chemically inert. It also ehnances the laser reflectivity of the AFM cantilevers in air and liquids. The resulting coated AFM tip radius is below 35 nm. The coating may cause AFM cantilever bending up to 3°.
Gold Overall
![]()



AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 35 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 1 N/m(0.1 - 4.6 N/m) | 90 kHz(30 - 160 kHz) | 110 µm(105 - 115µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
| Cantilever B | Beam | 2 N/m(0.2 - 9 N/m) | 130 kHz(45 - 240 kHz) | 90 µm(85 - 95µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
| Cantilever C | Beam | 0.6 N/m(0.06 - 2.7 N/m) | 65 kHz(25 - 115 kHz) | 130 µm(125 - 135µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
All typical values
XNC12/Cr-Au
AFM Probe with Gold Coated Silicon Nitride AFM Cantilevers, Gold Overall
FM probes of the XNC12 series have 2 silicon nitride AFM cantilevers and AFM tips on a glass holder chip. They are used for soft contact mode applications.
The overall gold coating with 20 nm chromium sublayer is electrically conductive and chemically inert. It also ehnances the laser reflectivity of the AFM cantilevers. The coating may cause AFM cantilever bending up to 3°
Gold Overall
![]()



AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Pyramid | 3.5 µm | 40° | < 10 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Triangle | 0.08 N/m | 17 kHz | 200 µm(190 - 210µm) | 28 µm(23 - 33µm) | 500 nm(425 - 575 nm) |
| Cantilever B | Triangle | 0.32 N/m | 67 kHz | 100 µm(90 - 110µm) | 13.5 µm(8.5 - 18.5µm) | 500 nm(425 - 575 nm) |
All typical values
HQ:CSC17/Cr-Au
Gold Coated Contact Mode AFM Probe, Gold Overall
AFM probes of the HQ:CSC17 series have AFM cantilevers with low force constants that offer high sensitivity in contact mode AFM. These AFM probes are also used for Lateral Force Microscopy.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm Au coating with 20 nm Cr sublayer is electrically conductive and chemically inert. It also ehnances the laser reflectivity of the AFM cantilever in air and liquids. The resulting coated AFM tip radius is below 35 nm. The coating may cause AFM cantilever bending up to 3°.
Gold Overall
![]()



AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 35 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 0.18 N/m(0.06 - 0.4 N/m) | 13 kHz(10 - 17 kHz) | 450 µm(445 - 455µm) | 50 µm(47 - 53µm) | 2 µm(1.5 - 2.5 µm) |
All typical values
HQ:CSC37/Cr-Au
AFM Probe with 3 Different Gold Coated Contact Mode AFM Cantilevers, Gold Overall
AFM probes of the HQ:CSC37 series have three different contact mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm Au coating with 20 nm Cr sublayer is electrically conductive and chemically inert. It also ehnances the laser reflectivity of the AFM cantilevers in air and liquids. The resulting coated AFM tip radius is below 35 nm. The coating may cause AFM cantilever bending up to 3°.
Gold Overall
![]()



AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 35 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 0.8 N/m(0.3 - 2 N/m) | 40 kHz(30 - 55 kHz) | 250 µm(245 - 255µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
| Cantilever B | Beam | 0.3 N/m(0.1 - 0.6 N/m) | 20 kHz(15 - 30 kHz) | 350 µm(345 - 355µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
| Cantilever C | Beam | 0.4 N/m(0.1 - 1 N/m) | 30 kHz(20 - 40 kHz) | 300 µm(295 - 305µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
All typical values
HQ:NSC14/Cr-Au
Gold Coated Soft Tapping Mode AFM Probe, Gold Overall
AFM probes of the HQ:NSC14 series are generally used in tapping mode for imaging relatively soft samples to obtain better phase contrast and reduce surface deformations caused by the tapping AFM tip.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm Au coating with 20 nm Cr sublayer is electrically conductive and chemically inert. It also ehnances the laser reflectivity of the AFM cantilever in air and liquids. The resulting coated AFM tip radius is below 35 nm. The coating may cause AFM cantilever bending up to 3°.
Gold Overall
![]()



AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40 | < 35 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 5 N/m(1.8 - 13 N/m) | 160 kHz(110 - 220 kHz) | 125 µm(120 - 130µm) | 25 µm(22 - 28µm) | 2.1 µm(1.6 - 2.6 µm) |
All typical values
HQ:NSC15/Cr-Au
Gold Coated Tapping Mode AFM Probe, Gold Overall
AFM probes of the HQ:NSC15 series are generally used in tapping mode for imaging hard samples when high topographic and phase contrast are necessary. These AFM probes are also suitable for non-contact mode.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The gold reflective coating enhances the laser reflectivity of the AFM cantilever for operation in air and liquids.
The overall 30 nm Au coating with 20 nm Cr sublayer is electrically conductive and chemically inert. It also ehnances the laser reflectivity of the AFM cantilever in air and liquids. The resulting coated AFM tip radius is below 35 nm. The coating may cause AFM cantilever bending up to 3°.
Gold Overall
![]()



AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 35 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 40 N/m(20 - 80 N/m) | 325 kHz(265 - 410 kHz) | 125 µm(120 - 130µm) | 30 µm(27 - 33µm) | 4 µm(3.5 - 4.5 µm) |
All typical values
HQ:NSC16/Cr-Au
Gold Coated Tapping Mode AFM Probe with Long AFM Cantilever, Gold Overall
AFM probes of the HQ:NSC16 series have AFM cantilevers with a high spring constant and low resonance frequency (below 250 kHz) that can be used in tapping mode in SPMs with low-frequency feedback loops. These AFM probes also fit SPM systems that do not support short AFM cantilever arms.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm Au coating with 20 nm Cr sublayer is electrically conductive and chemically inert. It also ehnances the laser reflectivity of the AFM cantilever in air and liquids. The resulting coated AFM tip radius is below 35 nm. The coating may cause AFM cantilever bending up to 3°.
Gold Overall
![]()



AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 35 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 45 N/m(30 - 70 N/m) | 190 kHz(170 - 210 kHz) | 225 µm(220 - 230µm) | 37.5 µm(34.5 - 40.5µm) | 7 µm(6.5 - 7.5 µm) |
All typical values
HQ:CSC38/Cr-Au
AFM Probe with 3 Different Gold Coated Contact Mode AFM Cantilevers, Low Force Constant, Gold Overall
AFM probes of the HQ:CSC38 series have three different soft contact mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm Au coating with 20 nm Cr sublayer is electrically conductive and chemically inert. It also ehnances the laser reflectivity of the AFM cantilevers in air and liquids. The resulting coated AFM tip radius is below 35 nm. The coating may cause AFM cantilever bending up to 3°.
Gold Overall
![]()



AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 35 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 0.09 N/m(0.01 - 0.36 N/m) | 20 kHz(8 - 32 kHz) | 250 µm(245 - 255µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
| Cantilever B | Beam | 0.03 N/m(0.003 - 0.13 N/m) | 10 kHz(5 - 17 kHz) | 350 µm(345 - 355µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
| Cantilever C | Beam | 0.05 N/m(0.005 - 0.21 N/m) | 14 kHz(6 - 23 kHz) | 300 µm(295 - 305µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
All typical values
Documentation
Documentation
🚚 Estimated Delivery: 5 - 6 weeks from payment confirmation
View full details
