High Resolution AFM Probes
High Resolution AFM Probes
Typical spike radius
1nm
Spike height
100-200nm
Total AFM tip height
12-18µm
AFM probe material
n-type silicon
AFM probe bulk resistivity
0.01-0.025 Ohm·cm
AFM probe coating
Gold
The Hi’Res-C AFM probes have a diamond-like spike on the apex of the silicon AFM tip. The sharpness of the spike determines the resolution. The high-resolution AFM probes are recommended for scanning small areas below 250nm at 512 sampling points. Lateral resolution below 1nm is attainable.
The probes feature an overall gold coating for improved laser reflectivity and chemical intertness. The diamond-like spike is not coated!
1 AFM Cantilever Series
| AFM Cantilever | Resonance Frequency, kHz | Force Constant, N/m | ||||
|---|---|---|---|---|---|---|
| min | typical | max | min | typical | max | |
| 14 series | 110 | 160 | 220 | 1.8 | 5.0 | 13 |
| 15 series | 265 | 325 | 410 | 20 | 40 | 80 |
| 18 series | 60 | 75 | 90 | 1.2 | 2.8 | 5.5 |
| 19 series | 25 | 65 | 120 | 0.05 | 0.5 | 2.3 |
Application
AFM has become the tool of choice for non-destructive surface measurements with molecular and sub-molecular resolution. However, the resolution and accuracy of the technique is limited by the size and shape of the AFM tip. In order to increase resolution, it is necessary to decrease both the AFM tip size and the AFM tip-sample interaction force
The development of the line of Hi’Res-C AFM probes has overcome these obstacles and made higher resolution, sub-nanometer imaging possible. The Hi’Res AFM probes allow for more accurate measurement of extremely narrow features such as pores, trenches, and sharp edges, along with accurate measurement of sub-nanometer surface roughness.
In addition, these AFM probes are also suitable for imaging soft, fragile and near-liquid samples as the AFM tip-sample attraction force is significantly reduced due to the unsurpassed sub-nanometer AFM tip radius.
Routine height images of carbosilane dendrimers (9th generation) in a dense film obtained using Bruker Multimode Nanoscope IIIa AFM. Scan size 150nm. Diameter of dendrimer molecules is 9nm. Images courtesy of S.S. Sheiko (University of North Caroline at Chapel Hill) and D.A. Ivanov (Free University of Brussels). Dendrimers courtesy of A. M. Muzafarov (ISPM RAS, Moscow.)
Hi'Res-C AFM probes suffer less contamination than silicon SPM probes and allow obtaining many high-resolution scans when proper care is taken during use. Due to the small AFM tip curvature radius, the AFM tip-sample attraction force is minimized.
The advantages of the Hi'Res-C AFM probes are noticeable when scanning smaller areas (<250nm) and flat samples. On larger images, the resolution is similar to that of general purpose AFM probes. The Hi'Res-C AFM probes are not suitable for corrugated samples.
Hi'Res-C15/Cr-Au
High Resolution, Tapping Mode AFM Probe
The high-resolution AFM probes of the Hi'Res-C series feature a hydrophobic diamond-like spike at the apex of the silicon etched AFM tip.
AFM probes of the HQ:NSC19 series combine relatively high resonance frequency and low force constant, which makes them suitable for imaging soft and fragile surfaces at relatively high speeds in Soft tapping mode. They are compatible with Bruker ScanAsyst® PeakForce Tapping™*.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm Au coating with 20 nm Cr sublayer is chemically inert. It also ehnances the laser reflectivity of the AFM cantilever in air and liquids. The coating does not cover the spike.
Reflective Gold
AFM Probe Specifications
AFM Tip
| Shape | Height | Radius |
|---|---|---|
| Supersharp | 15 µm (12 - 18 µm) | < 1 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 40 N/m(20 - 80 N/m) | 325 kHz(265 - 410 kHz) | 125 µm(120 - 130µm) | 30 µm(27 - 33µm) | 4 µm(3.5 - 4.5 µm) |
All typical values
Hi'Res-C18/Cr-Au
High Resolution, Soft Tapping Mode AFM Probe
The high-resolution AFM probes of the Hi'Res-C series feature a hydrophobic diamond-like spike at the apex of the silicon etched AFM tip.
AFM probes of the HQ:NSC18 series series are suitable for soft tapping and Lift mode operation AFM, Force modulation mode and true topography imaging of soft samples in Soft tapping mode.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm Au coating with 20 nm Cr sublayer is chemically inert. It also ehnances the laser reflectivity of the AFM cantilever in air and liquids. The coating does not cover the spike.
Reflective Gold
AFM Probe Specifications
AFM Tip
| Shape | Height | Radius |
|---|---|---|
| Supersharp | 15 µm (12 - 18 µm) | < 1 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 2.8 N/m(1.2 - 5.5 N/m) | 75 kHz(60 - 90 kHz) | 225 µm(220 - 230µm) | 27.5 µm(24.5 - 30.5µm) | 3 µm(2.5 - 3.5 µm) |
All typical values
Hi'Res-C19/Cr-Au
High Resolution, Soft Tapping Mode AFM Probe, Low Force Constant
The high-resolution AFM probes of the Hi'Res-C series feature a hydrophobic diamond-like spike at the apex of the silicon etched AFM tip.
AFM probes of the HQ:NSC19 series combine relatively high resonance frequency and low force constant, which makes them suitable for imaging soft and fragile surfaces at relatively high speeds in Soft tapping mode. They are compatible with Bruker ScanAsyst® PeakForce Tapping™*.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm Au coating with 20 nm Cr sublayer is chemically inert. It also ehnances the laser reflectivity of the AFM cantilever in air and liquids. The coating does not cover the spike.
Reflective Gold
AFM Probe Specifications
AFM Tip
| Shape | Height | Radius |
|---|---|---|
| Supersharp | 15 µm (12 - 18 µm) | < 1 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 0.5 N/m(0.05 - 2.3 N/m) | 65 kHz(25 - 120 kHz) | 125 µm(120 - 130µm) | 22.5 µm(19.5 - 25.5µm) | 1 µm(0.5 - 1.5 µm) |
All typical values
Documentation
Documentation
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