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Gold Coated AFM Probes

Gold Coated AFM Probes

Tap300GD-G

Tapping Mode AFM Probe with Gold Reflective Coating

AFM Probe Specifications:

AFM Tip

Shape: Rotated
Height: 17 µm (15 - 19 µm)*
Setback: 15 µm (10 - 20 µm)*
Radius: < 10 nm
Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever

Cantilever A
 Beam
 40 N/m (20 - 75 N/m)*
 300 kHz (200 - 400 kHz)*
 125 µm (115 - 135 µm)*
 30 µm (25 - 35 µm)*
 4 µm (3 - 5 µm)*
* typical range

Coating

Gold coating on detector side of the cantilever, 70 nm thick

Alignment Grooves

This product features alignment grooves on the back side of the holder chip.

Additional Info

Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation.

The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

Consistent high quality at a lower price!

Tap300GB-G

Tapping Mode AFM Probe with Gold Overall Coating

AFM Probe Specifications:

AFM Tip

Shape: Rotated
Height: 17 µm (15 - 19 µm)*
Setback: 15 µm (10 - 20 µm)*
Radius: < 25 nm
Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever

Cantilever A
 Beam
 40 N/m (20 - 75 N/m)*
 300 kHz (200 - 400 kHz)*
 125 µm (115 - 135 µm)*
 30 µm (25 - 35 µm)*
 4 µm (3 - 5 µm)*
* typical range

Coating

Overall gold coating, 70 nm thick

Alignment Grooves

This product features alignment grooves on the back side of the holder chip.

Additional Info

Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation.

The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

Not recommended for electric applications on abrasive sample surfaces!

Consistent high quality at a lower price!

Tap190GD-G

Tapping Mode AFM Probe with Long Cantilever and Gold Reflective Coating

AFM Probe Specifications:

AFM Tip

Shape: Rotated
Height: 17 µm (15 - 19 µm)*
Setback: 15 µm (10 - 20 µm)*
Radius: < 10 nm
Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever

Cantilever A
 Beam
48 N/m (28 - 75 N/m)*
190 kHz (160 - 220 kHz)*
225 µm (215 - 235 µm)*
38 µm (33 - 43 µm)*
7 µm (6 - 8 µm)*
* typical range

Coating

Gold coating on detector side of the cantilever, 70 nm thick

Alignment Grooves

This product features alignment grooves on the back side of the holder chip.

Additional Info

Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation.

The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

BudgetSensors' Tap190-G features a longer AFM cantilever and it is meant as an alternative to BudgetSensors' Tap300 AFM probes series, when the feedback loop of the AFM system does not accept high frequencies (400 kHz) or when the detection system needs a minimum AFM cantilever length > 125 µm. The scanning speed of Tap190 series AFM probes is slightly slower than the scanning speed of the Tap300 series.

Consistent high quality at a lower price!

Documentation

SDS

Technical Notes

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Variant Variant total Quantity Price Variant total
TAP300GD-G AFM Probe for Tapping Mode, Au reflex coating, alignment grooves (Unit: pkg/10)Tap300GD-G-10
TAP300GD-G AFM Probe for Tapping Mode, Au reflex coating, alignment grooves (Unit: pkg/10)Tap300GD-G-10
1.468,58 lei/ea		 0,00 lei
1.468,58 lei/ea 0,00 lei
TAP300GD-G AFM Probe for Tapping Mode, Au reflex coating, alignment grooves (Unit: pkg/50)Tap300GD-G-50
TAP300GD-G AFM Probe for Tapping Mode, Au reflex coating, alignment grooves (Unit: pkg/50)Tap300GD-G-50
6.100,27 lei/ea		 0,00 lei
6.100,27 lei/ea 0,00 lei
TAP300GB-G AFM Probe for Tapping Mode, Au overall coating, alignment grooves (Unit: pkg/10)Tap300GB-G-10
TAP300GB-G AFM Probe for Tapping Mode, Au overall coating, alignment grooves (Unit: pkg/10)Tap300GB-G-10
1.468,58 lei/ea		 0,00 lei
1.468,58 lei/ea 0,00 lei
TAP300GB-G AFM Probe for Tapping Mode, Au overall coating, alignment grooves (Unit: pkg/50)Tap300GB-G-50
TAP300GB-G AFM Probe for Tapping Mode, Au overall coating, alignment grooves (Unit: pkg/50)Tap300GB-G-50
6.100,27 lei/ea		 0,00 lei
6.100,27 lei/ea 0,00 lei
TAP190GD-G AFM Probe for Tapping Mode with Long Cantilever, Au reflex coating, alignment grooves (Unit: pkg/10)Tap190GD-G-10
TAP190GD-G AFM Probe for Tapping Mode with Long Cantilever, Au reflex coating, alignment grooves (Unit: pkg/10)Tap190GD-G-10
1.468,58 lei/ea		 0,00 lei
1.468,58 lei/ea 0,00 lei
TAP190GD-G AFM Probe for Tapping Mode with Long Cantilever, Au reflex coating, alignment grooves (Unit: pkg/50)Tap190GD-G-50
TAP190GD-G AFM Probe for Tapping Mode with Long Cantilever, Au reflex coating, alignment grooves (Unit: pkg/50)Tap190GD-G-50
6.100,27 lei/ea		 0,00 lei
6.100,27 lei/ea 0,00 lei
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