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Force Modulation AFM Probes

Force Modulation AFM Probes

Multi75-G

Force Modulation AFM Probe

AFM Probe Specifications:

AFM Tip

Shape: Rotated
Height: 17 µm (15 - 19 µm)*
Setback: 15 µm (10 - 20 µm)*
Radius: < 10 nm
Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever

Cantilever A
 Beam
 3 N/m (1 - 7 N/m)*
75 kHz (60 - 90 kHz)*
225 µm (215 - 235 µm)*
28 µm (23 - 33 µm)*
 3 µm (2 - 4 µm)*
* typical range

Coating

Uncoated

Alignment Grooves

This product features alignment grooves on the back side of the holder chip.

Additional Info

Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM).

The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

For measurements in liquids please use the back side gold coated Multi75GD-G or the overall gold coated Multi75GB-G!

Consistent high quality at a lower price!

Multi75Al-G

Force Modulation AFM Probe with Aluminum Reflective Coating

AFM Probe Specifications:

AFM Tip

Shape: Rotated
Height: 17 µm (15 - 19 µm)*
Setback: 15 µm (10 - 20 µm)*
Radius: < 10 nm
Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever

Cantilever A
 Beam
 3 N/m (1 - 7 N/m)*
75 kHz (60 - 90 kHz)*
225 µm (215 - 235 µm)*
28 µm (23 - 33 µm)*
 3 µm (2 - 4 µm)*
* typical range

Coating

Aluminium reflex coating on detector side of the cantilever, 30 nm thick

Alignment Grooves

This product features alignment grooves on the back side of the holder chip.

Additional Info

Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM).

The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

For measurements in liquids please use the back side gold coated Multi75GD-G or the overall gold coated Multi75GB-G!

Consistent high quality at a lower price!

Multi75GD-G

Force Modulation AFM Probe with Gold Reflective Coating

AFM Probe Specifications:

AFM Tip

Shape: Rotated
Height: 17 µm (15 - 19 µm)*
Setback: 15 µm (10 - 20 µm)*
Radius: < 10 nm
Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever

Cantilever A
 Beam
 3 N/m (1 - 7 N/m)*
75 kHz (60 - 90 kHz)*
225 µm (215 - 235 µm)*
28 µm (23 - 33 µm)*
 3 µm (2 - 4 µm)*
* typical range

Coating

Gold coating on detector side of the cantilever, 70 nm thick

Alignment Grooves

This product features alignment grooves on the back side of the holder chip.

Additional Info

Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM) in air and liquids.

The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

Consistent high quality at a lower price!

Documentation

SDS

Technical Notes

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Variant Variant total Quantity Price Variant total
Multi75-G Force Modulation AFM Probe, uncoated, alignment grooves (Unit: pkg/10)Multi75-G-10
Multi75-G Force Modulation AFM Probe, uncoated, alignment grooves (Unit: pkg/10)Multi75-G-10
1.101,44 lei/ea		 0,00 lei
1.101,44 lei/ea 0,00 lei
Multi75-G Force Modulation AFM Probe, uncoated, alignment grooves (Unit: pkg/50)Multi75-G-50
Multi75-G Force Modulation AFM Probe, uncoated, alignment grooves (Unit: pkg/50)Multi75-G-50
4.829,38 lei/ea		 0,00 lei
4.829,38 lei/ea 0,00 lei
Multi75-G Force Modulation AFM Probe, uncoated, alignment grooves (Unit: pkg/380)Multi75-G-380
Multi75-G Force Modulation AFM Probe, uncoated, alignment grooves (Unit: pkg/380)Multi75-G-380
25.417,80 lei/ea		 0,00 lei
25.417,80 lei/ea 0,00 lei
Multi75Al Force Modulation AFM Probe, Al reflex coating, alignment grooves (Unit: pkg/10)Multi75Al-G-10
Multi75Al Force Modulation AFM Probe, Al reflex coating, alignment grooves (Unit: pkg/10)Multi75Al-G-10
1.157,92 lei/ea		 0,00 lei
1.157,92 lei/ea 0,00 lei
Multi75Al Force Modulation AFM Probe, Al reflex coating, alignment grooves (Unit: pkg/50)Multi75Al-G-50
Multi75Al Force Modulation AFM Probe, Al reflex coating, alignment grooves (Unit: pkg/50)Multi75Al-G-50
5.055,32 lei/ea		 0,00 lei
5.055,32 lei/ea 0,00 lei
Multi75Al Force Modulation AFM Probe, Al reflex coating, alignment grooves (Unit: pkg/380)Multi75Al-G-380
Multi75Al Force Modulation AFM Probe, Al reflex coating, alignment grooves (Unit: pkg/380)Multi75Al-G-380
25.417,80 lei/ea		 0,00 lei
25.417,80 lei/ea 0,00 lei
Multi75GD-G Force Modulation AFM Probe, Au reflex coating, alignment grooves (Unit: pkg/10)Multi75GD-G-10
Multi75GD-G Force Modulation AFM Probe, Au reflex coating, alignment grooves (Unit: pkg/10)Multi75GD-G-10
1.468,58 lei/ea		 0,00 lei
1.468,58 lei/ea 0,00 lei
Multi75GD-G Force Modulation AFM Probe, Au reflex coating, alignment grooves (Unit: pkg/50)Multi75GD-G-50
Multi75GD-G Force Modulation AFM Probe, Au reflex coating, alignment grooves (Unit: pkg/50)Multi75GD-G-50
6.100,27 lei/ea		 0,00 lei
6.100,27 lei/ea 0,00 lei
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