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Diamond AFM Probes

Diamond AFM Probes

Diamond coated AFM tip close-up

Typical radius of uncoated AFM tip
8nm
Resulting AFM tip radius with the coating
<250nm
Full AFM tip cone angle
40°
Total AFM tip height
12-18µm
AFM probe material
n-type silicon
AFM tip coating
Conductive diamond
Detector coating
Aluminum

DMD AFM probes feature a thick doped diamond coating. The AFM tip shape is trihedral. The polycrystalline diamond structure ensures extreme durability at the expense of reduced resolution. The coating is also electrically conductive, allowing electrical measurements in contact mode such as Conductive AFM, Tunnelling Current AFM and Scanning Spreading Resistance Microscopy.

4 AFM Cantilevers Series

AFM Cantilever Resonance Frequency, kHz Force Constant, N/m
min typical max min typical max
11 series Cantilever A 15 18 22 0.25 0.5 1
Cantilever B 90 110 130 3.5 6.5 10
Cantilever C 170 210 250 10 18 30
Cantilever D 350 450 575 55 95 175


HQ:DMD-XSC11

AFM Probe with 4 Different Long Scanning, Conductive Diamond Coated AFM Cantilevers

AFM probes of the HQ:XSC11 series have four different AFM cantilevers, two on each side of the holder chip. They can be used in various applications.

The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.

A wear resistant and electrically conductive doped diamond coating with thickness around 100 nm is applied on the tip side of the AFM cantilevers. The aluminum reflective coating enhances the laser reflectivity of the AFM cantilevers by approximately 2.5 times.

Coating

Conductive Diamond

 

AFM Probe Specifications

AFM Tip

Shape Height Full Cone Angle Radius
Rotated 15 µm (12 - 18 µm) 40° < 250 nm

AFM Cantilever

Cantilever Shape Force Const. Res. Freq. Length Width Thickness
Cantilever A Beam 0.5 N/m(0.25 - 1 N/m) 18 kHz(15 - 22 kHz) 500 µm(495 - 505µm) 30 µm(27 - 33µm) 2.7 µm(2.2 - 3.2 µm)
Cantilever B Beam 6.5 N/m(3.5 - 10 N/m) 110 kHz(90 - 130 kHz) 210 µm(205 - 215µm) 30 µm(27 - 33µm) 2.7 µm(2.2 - 3.2 µm)
Cantilever C Beam 18 N/m(10 - 30 N/m) 210 kHz(170 - 250 kHz) 150 µm(145 - 155µm) 30 µm(27 - 33µm) 2.7 µm(2.2 - 3.2 µm)
Cantilever D Beam 95 N/m(55 - 175 N/m) 450 kHz(350 - 575 kHz) 100 µm(95 - 105µm) 50 µm(47 - 53µm) 2.7 µm(2.2 - 3.2 µm)

All typical values

Documentation

🚚 Estimated Delivery: 5 - 6 weeks from payment confirmation

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Variant Variant total Quantity Price Variant total
AFM Probe with 4 Different Long Scanning, Conductive Diamond Coated AFM Cantilevers, pkg/5 (Unit: each)HQ:DMD-XSC11-5
AFM Probe with 4 Different Long Scanning, Conductive Diamond Coated AFM Cantilevers, pkg/5 (Unit: each)HQ:DMD-XSC11-5
3.876,08 lei/ea
0,00 lei
3.876,08 lei/ea 0,00 lei
AFM Probe with 4 Different Long Scanning, Conductive Diamond Coated AFM Cantilevers, pkg/15 (Unit: each)HQ:DMD-XSC11-15
AFM Probe with 4 Different Long Scanning, Conductive Diamond Coated AFM Cantilevers, pkg/15 (Unit: each)HQ:DMD-XSC11-15
10.055,33 lei/ea
0,00 lei
10.055,33 lei/ea 0,00 lei
AFM Probe with 4 Different Long Scanning, Conductive Diamond Coated AFM Cantilevers, pkg/50 (Unit: each)HQ:DMD-XSC11-50
AFM Probe with 4 Different Long Scanning, Conductive Diamond Coated AFM Cantilevers, pkg/50 (Unit: each)HQ:DMD-XSC11-50
25.278,75 lei/ea
0,00 lei
25.278,75 lei/ea 0,00 lei

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