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Contact series for contact mode and pulse force mode

Contact series for contact mode and pulse force mode

Technical Data:
  Value Range
Resonant Freq. 13 kHz +/-4 kHz
Force Constant 0.2 N/m 0.07 - 0.4 N/m
Length 450 µm +/-10 µm
Mean Width 50 µm +/-5 µm
Thickness 2 µm +/-1 µm
Tip Height 17 µm +/-2 µm
Tip Set Back 15 µm +/-5 µm
Tip Radius <10 nm (Contact; ContAL; ContGD; ContGb)
<25nm (ElectriCont)
<15nm (ContDLC)
Also see individual probes.
Half Cone Angle 20°-25° along cantilever axis
25°-30° from side
10°-at the apex

 

 

Contact Tip radius <10nm
Application: Contact Mode, Pulsed Force Mode (PFM)
General: Rotated Monolithic silicon probe
Symetric Tip Shape
Alignment Grooves (except for 1, see below)
(Chipsize 3.4 x 1.6 x 0.3mm)
Coating: None

 

ContAL Tip radius <10nm
Application: Contact Mode, Pulsed Force Mode (PFM)
General:

Rotated Monolithic silicon probe
Symetric Tip Shape
Alignment Grooves or None
(Chipsize 3.4 x 1.6 x 0.3mm)
Coating: 30nm Al for enhanced reflectivity

 

ContGD Tip radius <10nm
Application: Contact Mode, Pulsed Force Mode (PFM)
General: Rotated Monolithic silicon probe
Symetric Tip Shape
Alignment Grooves
(Chipsize 3.4 x 1.6 x 0.3mm)
Coating: 70nm Au on back of cantilever

 

ContGB Tip radius <25nm
Application: Contact Mode, Pulsed Force Mode (PFM)
General: Rotated Monolithic silicon probe
Symetric Tip Shape
Alignment Grooves
(Chipsize 3.4 x 1.6 x 0.3mm)
Coating: 70nm Au on both sides of cantilever

 

ElectriCont-G Tip radius <25nm
Application: Contact Mode, Pulsed Force Mode (PFM) and Electric Modes like:
• Scanning Capacitance Microscopy (SCM)
• Electrostatic Force Microscopy (EFM)
• Kelvin Probe Force Microscopy (KFM)
• Scanning Probe Lithography
General: Rotated Monolithic silicon probe
Symetric Tip Shape
Alignment Grooves
(Chip size 3.4 x 1.6 x 0.3mm)
Coating: Electrically conductive Cr/Pt on both sides of cantilever. 5nm Cr covered with 25nm Pt.

Contact Resistance: 300 ohms on Pt thin film surface

ContDLC Tip radius <15nm
Application: Contact Mode
General: Rotated Monolithic silicon probe
Symmetric Tip Shape
Alignment grooves
(Chip size 3.4 x 1.6 x 0.3mm)
Coating: Diamond-Like-Coating on tip side of cantilever, 15nm thick
Aluminum Reflex coating on detector side of cantilever, 30nm thick
This probe uses an "on scan angle" symmetric tip to provide a more symmetric representation of features over 200nm.

 

 

Documentation

SDS

Technical Notes

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Variant Variant total Quantity Price Variant total
Silicon AFM Probes, Contact -G, no coating (Unit: pkg/10)CONTACT-G-10
Silicon AFM Probes, Contact -G, no coating (Unit: pkg/10)CONTACT-G-10
1.410,20 lei/ea		 0,00 lei
1.410,20 lei/ea 0,00 lei
Silicon AFM Probes, Contact -G, no coating (Unit: pkg/50)CONTACT-G-50
Silicon AFM Probes, Contact -G, no coating (Unit: pkg/50)CONTACT-G-50
5.982,90 lei/ea		 0,00 lei
5.982,90 lei/ea 0,00 lei
Silicon AFM Probes, Cont Al -G, Aluminum Reflex coating (Unit: pkg/10)CONTAL-G-10
Silicon AFM Probes, Cont Al -G, Aluminum Reflex coating (Unit: pkg/10)CONTAL-G-10
1.410,20 lei/ea		 0,00 lei
1.410,20 lei/ea 0,00 lei
Silicon AFM Probes, Cont Al -G, Aluminum Reflex coating (Unit: pkg/50)CONTAL-G-50
Silicon AFM Probes, Cont Al -G, Aluminum Reflex coating (Unit: pkg/50)CONTAL-G-50
6.265,60 lei/ea		 0,00 lei
6.265,60 lei/ea 0,00 lei
Silicon AFM Probes, Cont GD, part Au coated (Unit: pkg/10)CONTGD-G-10
Silicon AFM Probes, Cont GD, part Au coated (Unit: pkg/10)CONTGD-G-10
1.832,60 lei/ea		 0,00 lei
1.832,60 lei/ea 0,00 lei
Silicon AFM Probes, Cont GD, part Au coated (Unit: pkg/50)CONTGD-G-50
Silicon AFM Probes, Cont GD, part Au coated (Unit: pkg/50)CONTGD-G-50
7.603,20 lei/ea		 0,00 lei
7.603,20 lei/ea 0,00 lei
Silicon AFM Probes, Cont GB -G, overall Au coated (Unit: pkg/10)CONTGB-G-10
Silicon AFM Probes, Cont GB -G, overall Au coated (Unit: pkg/10)CONTGB-G-10
1.832,60 lei/ea		 0,00 lei
1.832,60 lei/ea 0,00 lei
Silicon AFM Probes, Cont GB -G, overall Au coated (Unit: pkg/50)CONTGB-G-50
Silicon AFM Probes, Cont GB -G, overall Au coated (Unit: pkg/50)CONTGB-G-50
7.603,20 lei/ea		 0,00 lei
7.603,20 lei/ea 0,00 lei
Silicon AFM Probes, ElectriCont-G, overall Cr/Pt coating (Unit: pkg/10)CONTE-G-10
Silicon AFM Probes, ElectriCont-G, overall Cr/Pt coating (Unit: pkg/10)CONTE-G-10
1.689,60 lei/ea		 0,00 lei
1.689,60 lei/ea 0,00 lei
Silicon AFM Probes, ElectriCont-G, overall Cr/Pt coating (Unit: pkg/50)CONTE-G-50
Silicon AFM Probes, ElectriCont-G, overall Cr/Pt coating (Unit: pkg/50)CONTE-G-50
8.800,00 lei/ea		 0,00 lei
8.800,00 lei/ea 0,00 lei
Silicon AFM Probes, Cont DLC, DLC coating on tip (Unit: pkg/10)CONTDLC-10
Silicon AFM Probes, Cont DLC, DLC coating on tip (Unit: pkg/10)CONTDLC-10
1.980,00 lei/ea		 0,00 lei
1.980,00 lei/ea 0,00 lei
Silicon AFM Probes, Cont DLC, DLC coating on tip (Unit: pkg/50)CONTDLC-50
Silicon AFM Probes, Cont DLC, DLC coating on tip (Unit: pkg/50)CONTDLC-50
9.702,00 lei/ea		 0,00 lei
9.702,00 lei/ea 0,00 lei
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