-
Typical radius of uncoated AFM tip
8 nm
Full AFM tip cone angle
40
Total AFM tip height
12 - 18 µm
AFM probe material
n-type silicon
AFM probe bulk resistivity
0.01 - 0.025 Ohm·cmThe HQ:CSC and HQ:XSC AFM tips have trihedral shape with a full cone angle of 40° and even smaller at the last 200nm of the AFM tip apex. The contact mode AFM probes feature AFM cantilevers with low stiffness and force constants <0.4N/m. They offer high sensitivity in contact mode AFM. These AFM probes are also used for Lateral Force Microscopy.
The aluminum reflective coating enhances the laser reflectivity of the AFM cantilever by approximately 2.5 times.
There is a range of available AFM cantilever coatings for tip side and back side. Please check the other catalog categories for coated versions of the contact mode AFM probes.
The highly successful HQ series now extends over all AFM probe series with 1, 3 and 4 AFM cantilevers.
1 AFM Cantilever Series
AFM Cantilever Resonance Frequency, kHz Force Constant, N/m min typical max min typical max 17 series 10 13 17 0.06 0.18 0.40 3 AFM Cantilevers Series
AFM Cantilever Resonance Frequency, kHz Force Constant, N/m min typical max min typical max 37 series Cantilever A 30 40 55 0.3 0.8 2 Cantilever B 15 20 30 0.1 0.3 0.6 Cantilever C 20 30 40 0.1 0.4 1 38 series Cantilever A 8 20 32 0.01 0.09 0.36 Cantilever B 5 10 17 0.003 0.03 0.13 Cantilever C 6 14 23 0.005 0.05 0.21 4 AFM Cantilevers Series
AFM Cantilever Resonance Frequency, kHz Force Constant, N/m min typical max min typical max 11 series Cantilever A 12 15 18 0.1 0.2 0.4 Cantilever B 60 80 100 1.1 2.7 5.6 Cantilever C 115 155 200 3 7 16 Cantilever D 250 350 465 17 42 90
Contact Mode AFM Probes
Contact Mode AFM Probes
HQ AFM tip close-up
HQ:CSC17/Al BS
Contact Mode AFM Probe, Reflective Aluminum Coating
AFM probes of the HQ:CSC17 series have AFM cantilevers with low force constants that offer high sensitivity in contact mode AFM. These AFM probes are also used for Lateral Force Microscopy.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The aluminum reflective coating enhances the laser reflectivity of the AFM cantilever by approximately 2.5 times. For operation in liquids we recommend using the HQ:CSC17/Cr-Au BS with a reflective gold coating.
Reflective Aluminum
AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 8 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 0.18 N/m(0.06 - 0.4 N/m) | 13 kHz(10 - 17 kHz) | 450 µm(445 - 455µm) | 50 µm(47 - 53µm) | 2 µm(1.5 - 2.5 µm) |
All typical values
XNC12/Cr-Au BS
AFM Probe with Gold Coated Silicon Nitride AFM Cantilevers
AFM probes of the XNC12 series have 2 silicon nitride AFM cantilevers and AFM tips on a glass holder chip. They are used for soft contact mode applications.
The gold reflective coating enhances the laser reflectivity of the AFM cantilevers.
Reflective Gold
AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Pyramid | 3.5 µm | 40° | < 10 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Triangle | 0.08 N/m | 17 kHz | 200 µm(190 - 210µm) | 28 µm(23 - 33µm) | 500 nm(425 - 575 nm) |
| Cantilever B | Triangle | 0.32 N/m | 67 kHz | 100 µm(90 - 110µm) | 13.5 µm(8.5 - 18.5µm) | 500 nm(425 - 575 nm) |
All typical values
HQ:XSC11/Al BS (click to link)
AFM Probe with 4 Different Cantilevers for Various Applications, Reflective Aluminum Coating
HQ:XSC11/No Al (clik to link)
AFM Probe with 4 Different Cantilevers for Various Applications, No Coating
HQ:CSC17/No Al
Contact Mode AFM Probe, No Coating
AFM probes of the HQ:CSC17 series have AFM cantilevers with low force constants that offer high sensitivity in contact mode AFM. These AFM probes are also used for Lateral Force Microscopy.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
none
AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 8 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 0.18 N/m(0.06 - 0.4 N/m) | 13 kHz(10 - 17 kHz) | 450 µm(445 - 455µm) | 50 µm(47 - 53µm) | 2 µm(1.5 - 2.5 µm) |
All typical values
HQ:CSC37/Al BS
AFM Probe with 3 Different Contact Mode AFM Cantilevers, Reflective Aluminum Coating
AFM probes of the HQ:CSC37 series have three different contact mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The aluminum reflective coating enhances the laser reflectivity of the AFM cantilevers by approximately 2.5 times. For operation in liquids we recommend using the HQ:NSC36/Cr-Au BS with a reflective gold coating.
Reflective Aluminum
AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 8 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 0.8 N/m(0.3 - 2 N/m) | 40 kHz(30 - 55 kHz) | 250 µm(245 - 255µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
| Cantilever B | Beam | 0.3 N/m(0.1 - 0.6 N/m) | 20 kHz(15 - 30 kHz) | 350 µm(345 - 355µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
| Cantilever C | Beam | 0.4 N/m(0.1 - 1 N/m) | 30 kHz(20 - 40 kHz) | 300 µm(295 - 305µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
All typical values
HQ:CSC38/Al BS
AFM Probe with 3 Different Contact Mode AFM Cantilevers, Low Force Constant, Reflective Aluminum Coating
AFM probes of the HQ:CSC38 series have three different soft contact mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The aluminum reflective coating enhances the laser reflectivity of the AFM cantilevers by approximately 2.5 times. For operation in liquids we recommend using the HQ:NSC36/Cr-Au BS with a reflective gold coating.
Reflective Aluminum
AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 8 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 0.09 N/m(0.01 - 0.36 N/m) | 20 kHz(8 - 32 kHz) | 250 µm(245 - 255µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
| Cantilever B | Beam | 0.03 N/m(0.003 - 0.13 N/m) | 10 kHz(5 - 17 kHz) | 350 µm(345 - 355µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
| Cantilever C | Beam | 0.05 N/m(0.005 - 0.21 N/m) | 14 kHz(6 - 23 kHz) | 300 µm(295 - 305µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
All typical values
HQ:CSC37/No Al
AFM Probe with 3 Different Contact Mode AFM Cantilevers, No Coating
AFM probes of the HQ:CSC37 series have three different contact mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
none
AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 8 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 0.8 N/m(0.3 - 2 N/m) | 40 kHz(30 - 55 kHz) | 250 µm(245 - 255µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
| Cantilever B | Beam | 0.3 N/m(0.1 - 0.6 N/m) | 20 kHz(15 - 30 kHz) | 350 µm(345 - 355µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
| Cantilever C | Beam | 0.4 N/m(0.1 - 1 N/m) | 30 kHz(20 - 40 kHz) | 300 µm(295 - 305µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
All typical values
HQ:CSC38/No Al
AFM Probe with 3 Different Contact Mode AFM Cantilevers, Low Force Constant, No Coating
AFM probes of the HQ:CSC38 series have three different soft contact mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
None
AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 8 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 0.09 N/m(0.01 - 0.36 N/m) | 20 kHz(8 - 32 kHz) | 250 µm(245 - 255µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
| Cantilever B | Beam | 0.03 N/m(0.003 - 0.13 N/m) | 10 kHz(5 - 17 kHz) | 350 µm(345 - 355µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
| Cantilever C | Beam | 0.05 N/m(0.005 - 0.21 N/m) | 14 kHz(6 - 23 kHz) | 300 µm(295 - 305µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
All typical values
Documentation
Documentation
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