1 6

Contact Mode AFM Probe

Contact Mode AFM Probe

Contact-G

Contact Mode AFM Probe

AFM Probe Specifications:

AFM Tip

Shape: Rotated
Height: 17 µm (15 - 19 µm)*
Setback: 15 µm (10 - 20 µm)*
Radius: < 10 nm
Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever

Cantilever A
 Beam
 0.2 N/m (0.07 - 0.4 N/m)*
13 kHz (9 - 17 kHz)*
450 µm (440 - 460 µm)*
50 µm (45 - 55 µm)*
 2 µm (1 - 3 µm)*
* typical range

Coating

Uncoated

Alignment Grooves

This product features alignment grooves on the back side of the holder chip.

Additional Info

Monolithic silicon AFM probe for contact mode and lateral force mode operation.

The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

For measurements in liquids please use the back side gold coated ContGD-G or the overall gold coated ContGB-G!

Consistent high quality at a lower price!

ContAl-G

Contact Mode AFM Probe with Aluminum Reflective Coating

AFM Probe Specifications:

AFM Tip

Shape: Rotated
Height: 17 µm (15 - 19 µm)*
Setback: 15 µm (10 - 20 µm)*
Radius: < 10 nm
Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever

Cantilever A
 Beam
 0.2 N/m (0.07 - 0.4 N/m)*
13 kHz (9 - 17 kHz)*
450 µm (440 - 460 µm)*
50 µm (45 - 55 µm)*
  2 µm (1 - 3 µm)*
* typical range

Coating

Aluminium reflex coating on detector side of the cantilever, 30 nm thick

Alignment Grooves

This product features alignment grooves on the back side of the holder chip.

Additional Info

Monolithic silicon AFM probe for contact mode and lateral force mode operation.

The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

For measurements in liquids please use the back side gold coated ContGD-G or the overall gold coated ContGB-G!

Consistent high quality at a lower price!


ContGD-G

Contact Mode AFM Probe with Gold Reflective Coating

AFM Probe Specifications:

AFM Tip

Shape: Rotated
Height: 17 µm (15 - 19 µm)*
Setback: 15 µm (10 - 20 µm)*
Radius: < 10 nm
Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever

Cantilever A
 Beam
 0.2 N/m (0.07 - 0.4 N/m)*
13 kHz (9 - 17 kHz)*
450 µm (440 - 460 µm)*
50 µm (45 - 55 µm)*
 2 µm (1 - 3 µm)*
* typical range

Coating

Gold coating on detector side of the cantilever, 70 nm thick

Alignment Grooves

This product features alignment grooves on the back side of the holder chip.

Additional Info

Monolithic silicon AFM probe for contact mode and lateral force mode operation.

The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

Consistent high quality at a lower price!

 

SiNi

Silicon Nitride Contact Mode AFM Probe with 2 Different Cantilevers on Each Side of Chip

AFM Probe Specifications:

AFM Tip

Shape: Pyramid
Height: 12 µm (10 - 14 µm)*
Radius: < 15 nm
Half Cone Angle: 35° (macroscopic)

4 AFM Cantilevers

Short Cantilever
Triangle
 0.27 N/m
 30 kHz
100 µm (90 - 110 µm)*
 16 µm (11 - 21 µm)*
 520 nm (470 - 570 nm)*
Long Cantilever
Triangle
 0.06 N/m
 10 kHz
200 µm (190 - 210 µm)*
 30 µm (25 - 35 µm)*
 520 nm (470 - 570 nm)*
* typical range

Coating

Gold/Chromium on detector side of the cantilever, 70 nm thick

Alignment Grooves

None

Additional Info

This competitively priced silicon nitride AFM probe features:

  • 2 silicon nitride AFM cantilevers for soft contact mode with two different lengths and force constants mounted on each side of a standard silicon support chip
  • silicon nitride wedge AFM tip
  • overall AFM tip height of 12 μm (effective > 800 nm) with a double tip spacing of 4.5 μm
  • macroscopic half cone angle of 35°
  • 450 micron thick silicon holder chip

Consistent high quality at a lower price!

Documentation

SDS

Technical Notes

View full details
Variant Variant total Quantity Price Variant total
Contact-G Contact Mode AFM Probe, uncoated, alignment grooves (Unit: pkg/10)Contact-G-10
Contact-G Contact Mode AFM Probe, uncoated, alignment grooves (Unit: pkg/10)Contact-G-10
1.101,44 lei/ea		 0,00 lei
1.101,44 lei/ea 0,00 lei
Contact-G Contact Mode AFM Probe, uncoated, alignment grooves (Unit: pkg/50)Contact-G-50
Contact-G Contact Mode AFM Probe, uncoated, alignment grooves (Unit: pkg/50)Contact-G-50
4.829,38 lei/ea		 0,00 lei
4.829,38 lei/ea 0,00 lei
Contact-G Contact Mode AFM Probe, uncoated, alignment grooves (Unit: pkg/380)Contact-G-380
Contact-G Contact Mode AFM Probe, uncoated, alignment grooves (Unit: pkg/380)Contact-G-380
25.417,80 lei/ea		 0,00 lei
25.417,80 lei/ea 0,00 lei
ContAl-G Contact Mode AFM Probe, Al reflex coating, alignment grooves (Unit: pkg/10)ContAl-G-10
ContAl-G Contact Mode AFM Probe, Al reflex coating, alignment grooves (Unit: pkg/10)ContAl-G-10
1.157,92 lei/ea		 0,00 lei
1.157,92 lei/ea 0,00 lei
ContAl-G Contact Mode AFM Probe, Al reflex coating, alignment grooves (Unit: pkg/50)ContAl-G-50
ContAl-G Contact Mode AFM Probe, Al reflex coating, alignment grooves (Unit: pkg/50)ContAl-G-50
5.055,32 lei/ea		 0,00 lei
5.055,32 lei/ea 0,00 lei
ContAl-G Contact Mode AFM Probe, Al reflex coating, alignment grooves (Unit: pkg/380)ContAl-G-380
ContAl-G Contact Mode AFM Probe, Al reflex coating, alignment grooves (Unit: pkg/380)ContAl-G-380
25.417,80 lei/ea		 0,00 lei
25.417,80 lei/ea 0,00 lei
ContGD-G Contact Mode AFM Probe, Au reflex coating, alignment grooves (Unit: pkg/10)ContGD-G-10
ContGD-G Contact Mode AFM Probe, Au reflex coating, alignment grooves (Unit: pkg/10)ContGD-G-10
1.468,58 lei/ea		 0,00 lei
1.468,58 lei/ea 0,00 lei
ContGD-G Contact Mode AFM Probe, Au reflex coating, alignment grooves (Unit: pkg/50)ContGD-G-50
ContGD-G Contact Mode AFM Probe, Au reflex coating, alignment grooves (Unit: pkg/50)ContGD-G-50
6.100,27 lei/ea		 0,00 lei
6.100,27 lei/ea 0,00 lei
Silicon Nitride Contact Mode AFM Probe with 2 Different Cantilevers on Each Side of Chip, Au/Cr coating, no alignment grooves (Unit: pkg/10)SiNi-10
Silicon Nitride Contact Mode AFM Probe with 2 Different Cantilevers on Each Side of Chip, Au/Cr coating, no alignment grooves (Unit: pkg/10)SiNi-10
1.327,37 lei/ea		 0,00 lei
1.327,37 lei/ea 0,00 lei
Silicon Nitride Contact Mode AFM Probe with 2 Different Cantilevers on Each Side of Chip, Au/Cr coating, no alignment grooves (Unit: pkg/30)SiNi-30
Silicon Nitride Contact Mode AFM Probe with 2 Different Cantilevers on Each Side of Chip, Au/Cr coating, no alignment grooves (Unit: pkg/30)SiNi-30
3.671,46 lei/ea		 0,00 lei
3.671,46 lei/ea 0,00 lei
Silicon Nitride Contact Mode AFM Probe with 2 Different Cantilevers on Each Side of Chip, Au/Cr coating, no alignment grooves (Unit: pkg/100)SiNi-100
Silicon Nitride Contact Mode AFM Probe with 2 Different Cantilevers on Each Side of Chip, Au/Cr coating, no alignment grooves (Unit: pkg/100)SiNi-100
11.579,22 lei/ea		 0,00 lei
11.579,22 lei/ea 0,00 lei
Silicon Nitride Contact Mode AFM Probe with 2 Different Cantilevers on Each Side of Chip, Au/Cr coating, no alignment grooves (Unit: pkg/300)SiNi-300
Silicon Nitride Contact Mode AFM Probe with 2 Different Cantilevers on Each Side of Chip, Au/Cr coating, no alignment grooves (Unit: pkg/300)SiNi-300
28.213,76 lei/ea		 0,00 lei
28.213,76 lei/ea 0,00 lei
View cart
0

Total items

0,00 lei

Product subtotal

Taxes, discounts and shipping calculated at checkout.
View cart