Conductive AFM Probes
Conductive AFM Probes
Pt coated, DPE (low-noise) and DPER (high-res) AFM Probes
Typical radius of uncoated AFM tip
8nm
Resulting AFM tip radius with the coating
<30nm (Pt coated)
<40nm (DPE)
<20nm (DPER)
Full AFM tip cone angle
40°
Total AFM tip height
12-18µm
AFM Probe material
n-type silicon
AFM Tip coating
Platinum
Detector coating
Platinum
The HQ:NSC and HQ:XSC AFM tips have trihedral shape with a full cone angle of 40° and even smaller at the last 200nm of the AFM tip apex. The overall conductive platinum coating makes them suitable for a wide range of electrical AFM applications. The platinum coating is a 30nm thick film on both sides of the AFM cantilever.
The special DPE AFM probes feature silicon AFM tips with a stack of conductive layers, which provides a more stable electrical signal and less noise. Because of the increased AFM tip radius, some reduction of resolution in the topography image is possible when using DPE AFM probes in comparison with the regular platinum coated AFM probes.
The special DPER AFM probes are made by depositing a thin platinum coating on silicon AFM tips. While the thickness of the coating on a flat AFM cantilever surface is about 15nm, there is only a 10nm increase in the AFM tip dimensions compared to bare silicon AFM probes.
1 AFM Cantilever Series
| AFM Cantilever | Resonance Frequency, kHz | Force Constant, N/m | ||||
|---|---|---|---|---|---|---|
| min | typical | max | min | typical | max | |
| 14 series | 110 | 160 | 220 | 1.8 | 5.0 | 13 |
| 15 series | 265 | 325 | 410 | 20 | 40 | 80 |
| 16 series | 170 | 190 | 210 | 30 | 45 | 70 |
| 17 series | 10 | 13 | 17 | 0.06 | 0.18 | 0.40 |
| 18 series | 60 | 75 | 90 | 1.2 | 2.8 | 5.5 |
3 AFM Cantilevers Series
| AFM Cantilever | Resonance Frequency, kHz | Force Constant, N/m | |||||
|---|---|---|---|---|---|---|---|
| min | typical | max | min | typical | max | ||
| 35 series | Cantilever A | 130 | 205 | 290 | 2.7 | 8.9 | 24 |
| Cantilever B | 185 | 300 | 430 | 4.8 | 16 | 44 | |
| Cantilever C | 95 | 150 | 205 | 1.7 | 5.4 | 14 | |
| 36 series | Cantilever A | 30 | 90 | 160 | 0.1 | 1.0 | 4.6 |
| Cantilever B | 45 | 130 | 240 | 0.2 | 2 | 9 | |
| Cantilever C | 25 | 65 | 115 | 0.06 | 0.6 | 2.7 | |
| 37 series | Cantilever A | 30 | 40 | 55 | 0.3 | 0.8 | 2 |
| Cantilever B | 15 | 20 | 30 | 0.1 | 0.3 | 0.6 | |
| Cantilever C | 20 | 30 | 40 | 0.1 | 0.4 | 1 | |
4 AFM Cantilevers Series
| AFM Cantilever | Resonance Frequency, kHz | Force Constant, N/m | |||||
|---|---|---|---|---|---|---|---|
| min | typical | max | min | typical | max | ||
| 11 series | Cantilever A | 12 | 15 | 18 | 0.1 | 0.2 | 0.4 |
| Cantilever B | 60 | 80 | 100 | 1.1 | 2.7 | 5.6 | |
| Cantilever C | 115 | 155 | 200 | 3 | 7 | 16 | |
| Cantilever D | 250 | 350 | 465 | 17 | 42 | 90 | |
Application of Pt coated AFM probes
The electric properties of different materials can be mapped to the topography images using AFM probes with conductive coatings, when AC or DC bias is applied between the AFM tip and the sample. Contact mode or two-pass operation technique can be used for this purpose. The data can be used for analysis of the structure and composition of heterogeneous samples as well as for quantitative characterization of individual grains or defects on surface.
Though silicon is conducting in bulk due to the presence of the dopants, the surface of the AFM probe is always coated by a thin (1-2nm) native oxide film. That is why using the conductivity of uncoated silicon AFM probes for AFM measurements is possible only in UHV conditions after the oxide film is removed. For imaging the electric properties of materials in ambient conditions, AFM probes with special conducting coatings are usually used.
Platinum coated AFM probes are comonly used for Electrostatic Force Microscopy (EFM) and Kelvin Probe Force Microscopy (KPFM) investigation.
Height and phase images of the rubber-modified isotactic polypropylene filled with carbon black. The images were obtained in Electric Force Microscopy mode using HQ:NSC14/Pt AFM probes. Images courtesy of S. Magonov (Bruker).
Application of HQ:DPE-XSC11
DPE AFM probes have increased coating thickness, which gives more freedom for using them in contact electrical modes. The AFM probes provide better performance and higher contrast of electrical signals, while the ability to resolve the small surface details might be reduced. The AFM probes can be used in electric AC modes when a study of the electric properties of a sample has higher priority. This is demonstrated in AM-FM images of a fluoroalkane layer.
Among the serious limitations of Electrical Force Microscopy are the sensitivity and signal-to-noise ratio. Enlargement of the AFM tip radius leads to a loss of resolution in both topography and EFM imaging, while it does not always reduce the noise in the maps of electric properties.
DPE AFM probes offer a special structure of conductive layers applied to the AFM tip that improves signal-to-noise ratio with little impact on the resolution.
Topography, surface potential and dC/dz scans of a fluoroalkane (F12H20) on a silicon substrate are presented in Fig. 1. below. As you see the resolution in topography image made using a standard platinum coated AFM probe (a) is better because the 6.5nm lamellar structures are clearly resolved and the shape of brighter features is not as rounded as in the image made with the DPE AFM probe (b). Still, the better signal-to-noise performance is provided by the DPE AFM probe (d,f).
(a) Topography image, Pt coated AFM probe
(b) Topography image, DPE AFM probe
(c) Surface potential map and cross-section, Pt coated AFM probe
(d) Surface potential map and cross-section, DPE AFM probe
(c) dC/dz map and cross-section, Pt coated AFM probe
DPE AFM probe
Comparison of AM-FM scans (5kHz-10kHz) of a fluoroalkane layer made using a regular Pt coated AFM probe and a DPE AFM probe. Scan size 350nm. The DPE AFM probe provides better signal-to-noise performance, while the topography resolution is better with the Pt-coated AFM probe. Images courtesy of Sergei Magonov, Agilent Technologies (Agilent 5500 AFM).
Detailed specifications of HQ:DPE-XSC11 »
Application of HQ:DPER-XSC11
The DPER AFM probes are made by depositing a thin contonuous Pt coating on silicon AFM tips. While the thickness of the coating on the flat AFM cantilever surface is about 15nm, there is only a 10nm increase of the AFM tip dimensions compared to the bare silicon AFM tips, resulting in an AFM tip radius below 20nm.
The DPER AFM probes can be used for imaging samples with high lateral resolution. Due to the thin coating, the electrical signal may be noisy. One should also not expect coating stability in contact or hard tapping regimes of AFM operation.
Single-pass KPFM scans of semifluorinated alkane (F14H20) deposited on graphite. The shape of brighter features in the scan made with a DPER AFM probe (a) is not as rounded as in the image made with the thicker Pt coated AFM tip (b). In addition to self-assembled structures on the top, the lamellar structures with 6.3nm spacing can be clearly seen in the underlying layer in DPER image (a). Still the better signal-to-noise peformance in surface potential images cannot be achieved with DPER AFM probe (a) in comparison to (b). Images courtesy of Sergei Magonov, Agilent Technologies (Agilent 5500 AFM).
HQ:NSC18/Pt
Conductive Soft Tapping Mode AFM Probe, Low Force Constant
AFM probes of the HQ:NSC18 series are suitable for soft tapping and Lift mode operation AFM (e.g. EFM and MFM) since they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These AFM probes are also used for mapping of materials properties in Force modulation mode and true topography imaging of soft samples in Soft tapping mode.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm platinum coating is electrically conductive and chemically inert. It also enhances the laser reflectivity of the AFM cantilever. The resulting coated AFM tip radius is below 30 nm.
Electrically Conductive
AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 30 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 2.8 N/m(1.2 - 5.5 N/m) | 75 kHz(60 - 90 kHz) | 225 µm(220 - 230µm) | 27.5 µm(24.5 - 30.5µm) | 3 µm(2.5 - 3.5 µm) |
All typical values
HQ:NSC35/Pt
AFM Probe with 3 Different Conductive Soft Tapping Mode AFM Cantilevers
AFM probes of the HQ:NSC35 series have three different soft tapping mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm platinum coating is electrically conductive and chemically inert. It also enhances the laser reflectivity of the AFM cantilevers. The resulting coated AFM tip radius is below 30 nm.
Electrically Conductive
AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 30 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 8.9 N/m(2.7 - 24 N/m) | 205 kHz(130 - 290 kHz) | 110 µm(105 - 115µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
| Cantilever B | Beam | 16 N/m(4.8 - 44 N/m) | 300 kHz(185 - 430 kHz) | 90 µm(85 - 95µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
| Cantilever C | Beam | 5.4 N/m(1.7 - 14 N/m) | 150 kHz(95 - 205 kHz) | 130 µm(125 - 135µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
All typical values
HQ:DMD-XSC11
AFM Probe with 4 Different Long Scanning, Conductive Diamond Coated AFM Cantilevers
AFM probes of the HQ:XSC11 series have four different AFM cantilevers, two on each side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
A wear resistant and electrically conductive doped diamond coating with thickness around 100 nm is applied on the tip side of the AFM cantilevers. The aluminum reflective coating enhances the laser reflectivity of the AFM cantilevers by approximately 2.5 times.
Conductive Diamond
AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 250 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 0.5 N/m(0.25 - 1 N/m) | 18 kHz(15 - 22 kHz) | 500 µm(495 - 505µm) | 30 µm(27 - 33µm) | 2.7 µm(2.2 - 3.2 µm) |
| Cantilever B | Beam | 6.5 N/m(3.5 - 10 N/m) | 110 kHz(90 - 130 kHz) | 210 µm(205 - 215µm) | 30 µm(27 - 33µm) | 2.7 µm(2.2 - 3.2 µm) |
| Cantilever C | Beam | 18 N/m(10 - 30 N/m) | 210 kHz(170 - 250 kHz) | 150 µm(145 - 155µm) | 30 µm(27 - 33µm) | 2.7 µm(2.2 - 3.2 µm) |
| Cantilever D | Beam | 95 N/m(55 - 175 N/m) | 450 kHz(350 - 575 kHz) | 100 µm(95 - 105µm) | 50 µm(47 - 53µm) | 2.7 µm(2.2 - 3.2 µm) |
All typical values
HQ:NSC36/Pt
AFM Probe with 3 Different Conductive Soft Tapping Mode AFM Cantilevers, Low Force Constant
AFM probes of the HQ:NSC36 series have three different soft tapping mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm platinum coating is electrically conductive and chemically inert. It also enhances the laser reflectivity of the AFM cantilevers. The resulting coated AFM tip radius is below 30 nm.
Electrically Conductive
AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 30 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 1 N/m(0.1 - 4.6 N/m) | 90 kHz(30 - 160 kHz) | 110 µm(105 - 115µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
| Cantilever B | Beam | 2 N/m(0.2 - 9 N/m) | 130 kHz(45 - 240 kHz) | 90 µm(85 - 95µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
| Cantilever C | Beam | 0.6 N/m(0.06 - 2.7 N/m) | 65 kHz(25 - 115 kHz) | 130 µm(125 - 135µm) | 32.5 µm(29.5 - 35.5µm) | 1 µm(0.5 - 1.5 µm) |
All typical values
HQ:DPER-XSC11
AFM Probe with 4 Different High Resolution Conductive AFM Cantilevers
AFM probes of the HQ:XSC11 series have four different AFM cantilevers, two on each side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall platinum coating is electrically conductive and chemically inert. The thickness of the DPER tip side coating is about 15 nm on the flat cantilever surface, resulting in a coated AFM tip radius below 20 nm. The AFM probes can be used for imaging samples with higher resolution in XY directions.
Electrically Conductive
AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 20 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 0.2 N/m(0.1 - 0.4 N/m) | 15 kHz(12 - 18 kHz) | 500 µm(495 - 505µm) | 30 µm(27 - 33µm) | 2.7 µm(2.2 - 3.2 µm) |
| Cantilever B | Beam | 2.7 N/m(1.1 - 5.6 N/m) | 80 kHz(60 - 100 kHz) | 210 µm(205 - 215µm) | 30 µm(27 - 33µm) | 2.7 µm(2.2 - 3.2 µm) |
| Cantilever C | Beam | 7 N/m(3 - 16 N/m) | 155 kHz(115 - 200 kHz) | 150 µm(145 - 155µm) | 30 µm(27 - 33µm) | 2.7 µm(2.2 - 3.2 µm) |
| Cantilever D | Beam | 42 N/m(17 - 90 N/m) | 350 kHz(250 - 465 kHz) | 100 µm(95 - 105µm) | 50 µm(47 - 53µm) | 2.7 µm(2.2 - 3.2 µm) |
All typical values
HQ:DPE-XSC11
AFM Probe with 4 Different Low Noise Conductive AFM Cantilevers
AFM probes of the HQ:XSC11 series have four different AFM cantilevers, two on each side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The DPE AFM probes have a special structure of conductive layers applied to the tip side of the AFM cantilevers that provides a better signal-to-noise ratio in the AFM scans of electric properties. The coating thickness is increased, which gives more freedom for using the DPE AFM probes in contact electrical modes. The AFM probes provide better performance and higher contrast of electrical signals, while the ability to resolve the small surface details might be reduced. The DPE AFM probes can be used in dynamic electric modes when a study of the electric properties of a sample has higher priority.
Electrically Conductive
AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 40 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 0.2 N/m(0.1 - 0.4 N/m) | 15 kHz(12 - 18 kHz) | 500 µm(495 - 505µm) | 30 µm(27 - 33µm) | 2.7 µm(2.2 - 3.2 µm) |
| Cantilever B | Beam | 2.7 N/m(1.1 - 5.6 N/m) | 80 kHz(60 - 100 kHz) | 210 µm(205 - 215µm) | 30 µm(27 - 33µm) | 2.7 µm(2.2 - 3.2 µm) |
| Cantilever C | Beam | 7 N/m(3 - 16 N/m) | 155 kHz(115 - 200 kHz) | 150 µm(145 - 155µm) | 30 µm(27 - 33µm) | 2.7 µm(2.2 - 3.2 µm) |
| Cantilever D | Beam | 42 N/m(17 - 90 N/m) | 350 kHz(250 - 465 kHz) | 100 µm(95 - 105µm) | 50 µm(47 - 53µm) | 2.7 µm(2.2 - 3.2 µm) |
All typical values
HQ:NSC15/Pt
Conductive Tapping Mode AFM Probe
AFM probes of the HQ:NSC15 series are generally used in tapping mode for imaging hard samples when high topographic and phase contrast are necessary. These AFM probes are also suitable for non-contact mode.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm platinum coating is electrically conductive and chemically inert. It also enhances the laser reflectivity of the AFM cantilever. The resulting coated AFM tip radius is below 30 nm.
Electrically Conductive
AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 30 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 40 N/m(20 - 80 N/m) | 325 kHz(265 - 410 kHz) | 125 µm(120 - 130µm) | 30 µm(27 - 33µm) | 4 µm(3.5 - 4.5 µm) |
All typical values
HQ:NSC16/Pt
Conductive Tapping Mode AFM Probe with Long AFM Cantilever
AFM probes of the HQ:NSC16 series have AFM cantilevers with a high spring constant and low resonance frequency (below 250 kHz) that can be used in tapping mode in SPMs with low-frequency feedback loops. These AFM probes also fit SPM systems that do not support short AFM cantilever arms.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm platinum coating is electrically conductive and chemically inert. It also enhances the laser reflectivity of the AFM cantilever. The resulting coated AFM tip radius is below 30 nm.
Electrically Conductive
AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 30 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 45 N/m(30 - 70 N/m) | 190 kHz(170 - 210 kHz) | 225 µm(220 - 230µm) | 37.5 µm(34.5 - 40.5µm) | 7 µm(6.5 - 7.5 µm) |
All typical values
HQ:NSC14/Pt
Conductive Soft Tapping Mode AFM Probe
AFM probes of the HQ:NSC14 series are generally used in tapping mode for imaging relatively soft samples to obtain better phase contrast and reduce surface deformations caused by the tapping AFM tip.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm platinum coating is electrically conductive and chemically inert. It also enhances the laser reflectivity of the AFM cantilever. The resulting coated AFM tip radius is below 30 nm.
Electrically Conductive
AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 30 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 5 N/m(1.8 - 13 N/m) | 160 kHz(110 - 220 kHz) | 125 µm(120 - 130µm) | 25 µm(22 - 28µm) | 2.1 µm(1.6 - 2.6 µm) |
All typical values
HQ:XSC11/Pt
AFM Probe with 4 Different Conductive AFM Cantilevers
AFM probes of the HQ:XSC11 series have four different AFM cantilevers, two on each side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm platinum coating is electrically conductive and chemically inert. It also enhances the laser reflectivity of the AFM cantilevers. The resulting coated AFM tip radius is below 30 nm.
Electrically Conductive
AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 30 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 0.2 N/m(0.1 - 0.4 N/m) | 15 kHz(12 - 18 kHz) | 500 µm(495 - 505µm) | 30 µm(27 - 33µm) | 2.7 µm(2.2 - 3.2 µm) |
| Cantilever B | Beam | 2.7 N/m(1.1 - 5.6 N/m) | 80 kHz(60 - 100 kHz) | 210 µm(205 - 215µm) | 30 µm(27 - 33µm) | 2.7 µm(2.2 - 3.2 µm) |
| Cantilever C | Beam | 7 N/m(3 - 16 N/m) | 155 kHz(115 - 200 kHz) | 150 µm(145 - 155µm) | 30 µm(27 - 33µm) | 2.7 µm(2.2 - 3.2 µm) |
| Cantilever D | Beam | 42 N/m(17 - 90 N/m) | 350 kHz(250 - 465 kHz) | 100 µm(95 - 105µm) | 50 µm(47 - 53µm) | 2.7 µm(2.2 - 3.2 µm) |
All typical values
HQ:CSC37/Pt
AFM Probe with 3 Different Conductive Contact Mode AFM Cantilevers
AFM probes of the HQ:CSC37 series have three different contact mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm platinum coating is electrically conductive and chemically inert. It also enhances the laser reflectivity of the AFM cantilevers. The resulting coated AFM tip radius is below 30 nm.
Electrically Conductive
AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 30 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 0.8 N/m(0.3 - 2 N/m) | 40 kHz(30 - 55 kHz) | 250 µm(245 - 255µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
| Cantilever B | Beam | 0.3 N/m(0.1 - 0.6 N/m) | 20 kHz(15 - 30 kHz) | 350 µm(345 - 355µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
| Cantilever C | Beam | 0.4 N/m(0.1 - 1 N/m) | 30 kHz(20 - 40 kHz) | 300 µm(295 - 305µm) | 35 µm(32 - 38µm) | 2 µm(1.5 - 2.5 µm) |
All typical values
HQ:CSC17/Pt
Conductive Contact Mode AFM Probe
AFM probes of the HQ:CSC17 series have AFM cantilevers with low force constants that offer high sensitivity in contact mode AFM. These AFM probes are also used for Lateral Force Microscopy.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm platinum coating is electrically conductive and chemically inert. It also enhances the laser reflectivity of the AFM cantilever. The resulting coated AFM tip radius is below 30 nm.
Electrically Conductive
AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Rotated | 15 µm (12 - 18 µm) | 40° | < 30 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever A | Beam | 0.18 N/m(0.06 - 0.4 N/m) | 13 kHz(10 - 17 kHz) | 450 µm(445 - 455µm) | 50 µm(47 - 53µm) | 2 µm(1.5 - 2.5 µm) |
All typical values
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