Backscattered Electron (BSE) Reference Standards

Backscatter imaging is a second imaging modality available in the SEM.
Whilst SE-imaging reveals the surface topography of our sample, BSE imaging can
provide information as to its composition. Elements with a high atomic number yield more backscatter electrons than elements with a low atomic number and hence appear brighter in the image.
Imaging a sample using BSE provides a Z-contrast image indicating differences in elemental composition. Samples for BSE imaging are imaged uncoated or coated with a layer of carbon to improve sample conductivity.
All of the BSE standards we manufacture can be customised by the customer if an
alternative material or accessory is preferred or required. If we do not have the
material you need from the 1,000+ materials we hold in stock, we will do our best to source it for you.
Supplied in a specially designed storage/transportation case that contains:
• The standard—protected by an additional specially designed case
• A full electronic booklet on a USB, containing:
• The standard plan/layout
• Certificates of analysis or conformance for each material
• Details on storage and care of your standards
• Certificate of final inspection & recommended re-polishing date
• A replaceable silica gel capsule for protection whilst in transit
• A credit card sized quick reference guide
A copy of the electronic booklet is also accessible from our cloud storage.

Dual Atomic Number Reference Standards

An electron microscope, when equipped with a Backscattered Electron Detector, has the capacity to produce images in which contrast is controlled by the differences in atomic numbers (Z) across the specimen.
These reference standards consists of two high purity elements that have an atomic number difference of 1, embedded side by side in a contrasting matrix into a 5mm Ø x 5mm brass mount.
Available to order as:
all embedded into a 5mm Ø x 5mm (thick) brass mount:

Duplex Brass Atomic Number Reference Standard

This standard allows checking the resolution and performance of the Backscattered Electron Detector. The resolution of a detector is usually quoted as 0.1 (Z) where the atomic number (Z) = 30. This is obtained in our standard by the mean atomic number between the phases of α/β Brass, being 0.1Z.

Available to order as:
ANC-DBR, Duplex Brass embedded into a brass mount, 5mm Ø x 5mm (thick)

Basic BSE Detector Test Standard

An electron microscope, when equipped with a Backscattered Electron Detector, has the capacity to produce images in which contrast is controlled by the differences in atomic numbers (Z) across the specimen. This reference specimen consists of four high purity elements that cover the low, medium, and high BSE grey scale. They are embedded in close proximity, in a contrasting matrix into a standard 12.7mm Ø pin stub.
The Carbon and Cobalt samples can also be used for the Beam Measurement & Energy Calibration of the EDS/WDS Detector if fitted to the SEM.

Available to order as:
ANC-PAS, Carbon / Cobalt / Gold / Rhodium, embedded into a standard 12.7mm Ø Pin stub.

BSE Detector Calibration Standard

Includes:

Available to order as:
BSE-30C, embedded into a Carbon disc, 30mm Ø x 5mm (thick).