All-In-One series with four cantilevers
All-In-One series with four cantilevers
The All-In-One Series probes offer four cantilevers with different geometry for all topography measurement modes: contact mode, force modulation, soft tapping and tapping mode. The resonance frequencies and force constants are similar to the ones of the well-established models Contact, Multi75, Tap150 and Tap300 or ContAL, Multi75AL, Tap150AL and Tap300AL for the model with Aluminum Reflex coating.
Available with tip and without tip (tipless).
The long cantilevers A for contact mode and B for force modulation are located at one end of the chip, while the short cantilevers C for soft tapping and D for tapping mode are located at the opposite end. The short cantilever end is marked by a trapezoidal pattern visible with bare eyes.
Technical Data: All-In-One | ||||||||
 | Cantilever A | Cantilever B | Cantilever C | Cantilever D | ||||
Application | Contact Mode |
Force modulation, |
Soft Tapping Mode, Intermittent Contact-Mode | Tapping Mode, Intermittent Contact-Mode | ||||
 | Values | Range | Values | Range | Values | Range | Values | Range |
Resonant Frequency | 15 kHz | +/-5 kHz | 80 kHz | +/-30 kHz | 150 kHz | +/-80 kHz | 350 kHz | +/-150 kHz |
Force Constant | 0.2 N/m | 0.04 - 0.7 N/m | 2.7 N/m | 0.4 - 10 N/m | 7.4 N/m | 1 - 29 N/m | 40 N/m | 7 - 160 N/m |
Resonant Frequency and Force Constant Similar to | Contact | Multi75 | Tap150-G | Tap300 | ||||
Cantilever Length | 500µm | +/-10µm | 210µm | +/-10µm | 150µm | +/-10µm | 100µm | +/-10µm |
Mean Width | 30µm | +/-5µm | 30µm | +/-5µm | 30µm | +/-5µm | 50µm | +/-5µm |
Thickness | 2.7µm | +/-1µm | 2.7µm | +/-1µm | 2.7µm | +/-1µm | 2.7µm | +/-1µm |
Tip Height | 17µm | +/-2µm | 17µm | +/-2µm | 17µm | +/-2µm | 17µm | +/-2µm |
Tip Set Back | 15µm | +/-5µm | 15µm | +/-5µm | 15µm | +/-5µm | 15µm | +/-5µm |
Tip Radius | < 10nm | |||||||
Coating | None or Aluminum Reflex | |||||||
Half Cone Angle | 20° - 25° along cantilever axis, 25° - 30° from side, 10° at the apex |
All-In-One:Â Tip radius <10nm | |
Application: | Several Measurement Modes |
General: | Rotated Monolithic Silicon Probe Symmetric Tip Shape Chipsize: 3.4 x 1.6 x 0.3 mm |
Coating: | None |
Technical Data: | This probe uses "on scan angle" symmetric tips to provide a more symmetric representation of features over 200 nm. |
Â
All-In-One-ALÂ Tip radius <10nm | |
Application: | Several Measurement Modes |
General: | Rotated Monolithic Silicon Probe Symmetric Tip Shape Chipsize: 3.4 x 1.6 x 0.3 mm |
Coating: | Aluminium reflex coating, 30 nm thick |
Technical Data: | This probe uses "on scan angle" symmetric tips to provide a more symmetric representation of features over 200 nm. |
Â
All-In-One-EÂ Tip radius <25nm | |
Application: | Several Measurement Modes |
General: | Rotated Monolithic Silicon Probe Symmetric Tip Shape Chipsize: 3.4 x 1.6 x 0.3 mm |
Coating: | Electrically Conductive coating, 30 nm thick |
Technical Data: | This probe uses "on scan angle" symmetric tips to provide a more symmetric representation of features over 200 nm. |
Â
All-In-One-DLCÂ Tip radius <25nm | |
Application: | Several Measurement Modes |
General: | Rotated Monolithic Silicon Probe Symmetric Tip Shape Chipsize: 3.4 x 1.6 x 0.3 mm |
Coating: | Diamond-Like-Coating on tip side of cantilever, 15nm thick Aluminum Reflex coating on detector side of cantilever, 30nm thick This probe uses an "on scan angle" symmetric tip to provide a more symmetric representation of features over 200nm |
Technical Data: | This probe uses an "on scan angle" symmetric tip to provide a more symmetric representation of features over 200nm |
Â
Â
Documentation
Documentation



