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All-In-One AFM Probes

All-In-One AFM Probes

AIO

(Also known as All-In-One)

Multipurpose AFM Probe with 4 Different Cantilevers

AFM Probe Specifications:

AFM Tip

Shape: Rotated
Height: 17 µm (15 - 19 µm)*
Setback: 15 µm (10 - 20 µm)*
Radius: < 10 nm
Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

4 AFM Cantilevers

Cantilever A - Contact Mode
 Beam
0.2 N/m (0.04 - 0.7 N/m)*
15 kHz (10 - 20 kHz)*
 500 µm (490 - 510 µm)*
30 µm (25 - 35 µm)*
 2.7 µm (1.7 - 3.7 µm)*

Cantilever B - Force Modulation
 Beam
2.7 N/m (0.4 - 10 N/m)*
80 kHz (50 - 110 kHz)*
 210 µm (200 - 220 µm)*
30 µm (25 - 35 µm)*
 2.7 µm (1.7 - 3.7 µm)*

Cantilever C - Soft Tapping
 Beam
7.4 N/m (1 - 29 N/m)*
150 kHz (70 - 230 kHz)*
 150 µm (140 - 160 µm)*
30 µm (25 - 35 µm)*
 2.7 µm (1.7 - 3.7 µm)*

Cantilever D - Tapping Mode
 Beam
40 N/m (7 - 160 N/m)*
350 kHz (200 - 500 kHz)*
 100 µm (90 - 110 µm)*
50 µm (45 - 55 µm)*
 2.7 µm (1.7 - 3.7 µm)*
* typical range

Coating

Uncoated

Alignment Grooves

none

Additional Info

Versatile monolithic silicon AFM probe with 4 different AFM cantilevers on a single AFM holder chip for various applications: contact mode, force modulation mode, soft tapping mode and high frequency tapping / non-contact mode.

The rotated AFM tips allow for more symmetric representation of high sample features. The consistent AFM tip radii ensure good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

The main advantage of this product compared to regular, single-cantilever AFM probes is the freedom to choose in the very last moment the right AFM cantilever for each application. You do not need to stock various AFM Probe types any more. Nevertheless, this product is not meant as a substitution to comparable single-cantilever AFM probes, because the geometry of each one of the All-In-One AFM cantilevers differs from the geometry of comparable specialized single-cantilever AFM probes.

Consistent high quality at a lower price!

AIOAl

(Also known as All-In-One-Al)

Multipurpose AFM Probe with 4 Different Cantilevers and Aluminum Reflective Coating

AFM Probe Specifications:

AFM Tip

Shape: Rotated
Height: 17 µm (15 - 19 µm)*
Setback: 15 µm (10 - 20 µm)*
Radius: < 10 nm
Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

4 AFM Cantilevers

Cantilever A - Contact Mode
 Beam
0.2 N/m (0.04 - 0.7 N/m)*
15 kHz (10 - 20 kHz)*
 500 µm (490 - 510 µm)*
30 µm (25 - 35 µm)*
 2.7 µm (1.7 - 3.7 µm)*

Cantilever B - Force Modulation
 Beam
 2.7 N/m (0.4 - 10 N/m)*
80 kHz (50 - 110 kHz)*
 210 µm (200 - 220 µm)*
30 µm (25 - 35 µm)*
 2.7 µm (1.7 - 3.7 µm)*

Cantilever C - Soft Tapping
 Beam
7.4 N/m (1 - 29 N/m)*
150 kHz (70 - 230 kHz)*
 150 µm (140 - 160 µm)*
30 µm (25 - 35 µm)*
 2.7 µm (1.7 - 3.7 µm)*

Cantilever D - Tapping Mode
 Beam
 40 N/m (7 - 160 N/m)*
350 kHz (200 - 500 kHz)*
 100 µm (90 - 110 µm)*
50 µm (45 - 55 µm)*
 2.7 µm (1.7 - 3.7 µm)*
* typical range

Coating

Aluminium reflex coating on detector side of the cantilever, 30 nm thick

Alignment Grooves

none

Additional Info

Versatile monolithic silicon AFM probe with 4 different AFM cantilevers on a single AFM holder chip for various applications: contact mode, force modulation mode, soft tapping mode and high frequency tapping / non-contact mode and electric modes such as: scanning capacitance microscopy (SCM), electrostatic force microscopy (EFM), Kelvin probe force microscopy (KFM), scanning probe lithography and conductive atomic force microscopy (C-AFM).

The doped polycristalling diamond AFM tip coating provides unprecedented hardness and durability, as well as electridcal conductivity for demanding electrical applications. The resulting AFM tip radius is in the range 100-250nm.

The rotated AFM tips allow for more symmetric representation of high sample features.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

The main advantage of this product compared to regular, single-cantilever AFM probes is the freedom to choose the right AFM cantilever for each application in the very last moment. You do not need to stock various AFM probe types any more. Nevertheless, this product is not meant as a substitution to comparable single-cantilever AFM probes, because the geometry of each one of the All-In-One AFM cantilevers differs from the geometry of the comparable specialized single-cantilever AFM probes.

Please note that the aluminum back side coating is not suitable for measurements in liquids!

Consistent high quality at a lower price!

Documentation

SDS

Technical Notes

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Variant Variant total Quantity Price Variant total
AIO Multipurpose AFM Probe with 4 Different Cantilevers, uncoated, no alignment grooves (Unit: pkg/10)AIO-10
AIO Multipurpose AFM Probe with 4 Different Cantilevers, uncoated, no alignment grooves (Unit: pkg/10)AIO-10
1.468,58 lei/ea		 0,00 lei
1.468,58 lei/ea 0,00 lei
AIO Multipurpose AFM Probe with 4 Different Cantilevers, uncoated, no alignment grooves (Unit: pkg/50)AIO-50
AIO Multipurpose AFM Probe with 4 Different Cantilevers, uncoated, no alignment grooves (Unit: pkg/50)AIO-50
5.930,82 lei/ea		 0,00 lei
5.930,82 lei/ea 0,00 lei
AIOAl Multipurpose AFM Probe with 4 Different Cantilevers and Aluminum Reflective Coating, Al coating on detector side of the cantilever, no alignment grooves (Unit: pkg/10)AIOAl-10
AIOAl Multipurpose AFM Probe with 4 Different Cantilevers and Aluminum Reflective Coating, Al coating on detector side of the cantilever, no alignment grooves (Unit: pkg/10)AIOAl-10
1.468,58 lei/ea		 0,00 lei
1.468,58 lei/ea 0,00 lei
AIOAl Multipurpose AFM Probe with 4 Different Cantilevers and Aluminum Reflective Coating, Al coating on detector side of the cantilever, no alignment grooves (Unit: pkg/50)AIOAl-50
AIOAl Multipurpose AFM Probe with 4 Different Cantilevers and Aluminum Reflective Coating, Al coating on detector side of the cantilever, no alignment grooves (Unit: pkg/50)AIOAl-50
5.930,82 lei/ea		 0,00 lei
5.930,82 lei/ea 0,00 lei
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