PELCO® XCS EDS Calibration Reference

New Styles Available for Cathodoluminescence,
Peak Deconvolution, and Raman Spectroscopy Reference

The PELCO^® XCS Calibration References are practical, high quality and compact EDS calibration samples embedded in a 12.7mm (1/2") diameter pin stub in clear resin and polished to a fine surface finish. Reference samples are available for general EDS work including either a Faraday cup for beam current or a grid for checking dimensions, as well as more specialized samples for backscattered electron detectors, light element detection performance, cathodoluminescence, peak deconvolution, and other performance metrics. The pure elements and compounds are mounted in 12.7mm (1/2") diameter stubs using resin and carbon-coated to ensure sufficient surface conductivity. The small size of the pin stub allows for using the PELCO^® XCS EDS Calibration Reference alongside specimens on readily available multi pin stub holders. This enables quick in-situ calibration and regular performance tests of the EDS system.

AISI 316L steel sample composition is noted on the reference card included with each standard. However, this is not a certified or traceable analysis to NIST or other standards body.

A Reference Material sample for Raman spectroscopy is also available as part of the PELCO^® XCS line. 

Note: Each PELCO^® XCS EDS X-ray calibration standard comes with a reference card from the manufacturer stating the elements in each position, and the composition of the AISI 316 stainless steel if included. This is not a certified or traceable analysis certificate.

Nominal Composition for AISI 316L Stainless Steel (actual composition will vary slightly and is included with sample)
Cr = 17.3%	Ni = 12.6%	Mo = 2.54%
Mn = 1.7%	N = 0.53%	Si = 0.47%
P = 0.029%	C = 0.021%	S = 0.002%
	Fe = Balance

 

12.7mm (1/2") Aluminum Pin Stub Specifications

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PELCO® XCS-5

 

Intended for essential EDS calibration and contains AISI 316L stainless steel, SiO2, Mn, B, C and a 200µm Cu aperture grid that serves as a Cu/Al reference as well as a Faraday cup, all embedded in a 12.7mm diameter aluminum pin stub.

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PELCO® XCS-6

Intended for EDS calibration and contains AISI 316L stainless steel, SiO2, Mn, B, C and a 200 mesh Cu grid which serves as a Cu/Al reference and a size reference with a 127 micron pitch, embedded  in a 12.7mm diameter aluminum pin stub.

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PELCO® XCS-7

Intended for BSD response curve calibration, the standard contains elements evenly spaced in the periodic table.  It contains, Ge, Nb, Au, C, Si and a 200µm Cu aperture grid for use as a Cu/Al reference and Faraday cup, embedded in a 12.7mm diameter aluminum pin stub. These standards are commonly used for tuning GSR (gun shot residue) software.

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PELCO® XCS-22

Intended for BSD response curve calibration for GSR and contains, Ge, Rh, Au, C, Si, Co and a 200µm Cu aperture grid in a 12.7mm diameter aluminum pin stub. Contains a cobalt sample, which is standard for calibration of Oxford Instruments EDS Systems.

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PELCO® XCS-8

Similar to the XCS-5, but with the addition of the nitrogen line from boron nitride. Intended for EDS calibration and contains AISI 316L stainless steel, SiO2, Mn, BN, C and a 200µm Cu aperture in a 12.7mm diameter aluminum pin stub.

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PELCO® XCS-12

Intended for checking light element analysis performance and contains CaB6, SiC, CrN, Fe2O3, CaF2 and a 200µm Cu aperture in a 12.7mm diameter aluminum pin stub.

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PELCO® XCS-CL

 

The XCS-CL contains a series of mineral samples that exhibit bright fluorescence suitable as a reference for cathodoluminescence detectors. As these produce considerable light, it can also be used to test light tightness of EDS detector windows. Samples are mounted on a polished standard 12.7mm pin stub.

The PELCO^® XCS-CL contains:

• Benitoite – BaTiSi3O9
• Apatite – Ca5(PO4)3(F,Cl,OH)
• Spinel – MgAl2O4
• Corundum – Al2O3
• Chrysoberyl – BeAl2O4
• Fluorite – CaF2
• Calcite – CaCO3

 

The materials used are natural mineral samples and may contain small amounts of secondary minerals.

These are not certified reference materials and are not supplied with a Certificate of Analysis. A Certificate of Conformance is available upon request for an additional fee.

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PELCO® XCS-PD

 

The XCS-PD reference contains a series of sample minerals with elements that overlap in the EDS spectrum. It is useful as a challenging test sample for assessing peak deconvolution and tuning auto peak deconvolution algorithms.

The PELCO^® XCS-PD contains:

• Zinkenite – Pb9Sb22S42
• Galena – PbS
• Enargite – Cu3AsS4
• Molybdenite – MoS2
• Wulfenite – PbMoO4
• Galkhaite – (Cs,Tl) (Hg,Cu,Zn)6(As,Sb)4S12
• Kleinite – Hg2N(Cl,SO4).n(H2O)
• Benitoite – BaTiSi3O9
• Kosnarite – KZr2(PO4)3
• Cinnabar – HgS

The materials used are natural mineral samples and may contain small amounts of secondary minerals.

Samples are mounted on a standard 12.7mm diameter pin stub.

These are not certified reference materials and are not supplied with a Certificate of Analysis. A Certificate of Conformance is available upon request for an additional fee.

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PELCO® XCS-R

The XCS-R contains a series of Raman-active minerals including common polymorphs of SiO2, TiO2, and others that are difficult to distinguish by other means. It can serve as a reference sample for Raman microscopes, and for SEM systems incorporating Raman.

The PELCO^® XCS-R contains:

• Silica – SiO2
• Quartz – SiO2
• Chalcedony – SiO2
• Aragonite – CaCO3
• Calcite – CaCO3
• Pyrite – FeS2
• Marcasite – FeS2
• Rutile – TiO2
• Anatase – TiO2
• Brookite – TiO2

The materials used are natural mineral samples and may contain small amounts of secondary minerals.

Samples are mounted in clear resin on a polished 12.7mm diameter pin stub and carbon-coated.

These are not certified reference materials and are not supplied with a Certificate of Analysis. A Certificate of Conformance is available upon request for an additional fee.