Graphene on PELCO® Holey Silicon Nitride

Crystalline Structure of Graphene Film

HAADF Image of single-layer Graphene (bar = 1nm) on Holey Silicon Nitride product.
Ref: J. Kotakoski, et. al. Nano Letters, 2015

This Graphene product is supported by #21535-10 Holey Silicon Nitride which has 2.5µm holes with a 4.5µm pitch in 200nm Si3N4 over a 0.5 x 0.5mm window size. The graphene sheet covers the complete window with the ultraflat Si3N4 holey membrane and leaves free standing graphene covering the 2.5µm holes. Total usable area is approx. 75% due to unavoidable folds and wrinkles in the graphene sheet. Available with single, 2, 3-5, and 6-8 layer graphene sheets. Research-ready product, suitable for UHR imaging or as ultra-flat experimental platform. 

Holey Silicon Nitride

High-resolution TEM image of single-layer Graphene showing a typical region for imaging.
Marker bar = 5nm

EELS Spectrum of single-layer Graphene

Typical Raman Spectrum of single-layer Graphene

Graphene Specifications

• The sheet resistance for a single layer of Graphene Film is 600Ω/sq.
• The thickness for a single layer of Graphene is approximately 0.35nm, Transparency is in the order of 96.4%.
  
• The thickness for 2 layers of Graphene is approximately 0.7nm, Transparency is in the order of 92.7%.
• The thickness for 3-5 layers of Graphene is between 1.0 - 1.7nm, Transparency ranges from 90.4 - 85.8%.
• The thickness for the 6-8 layers of Graphene is between 2.1 - 2.8nm, Transparency ranges from 83.2 - 78.5%.

The PELCO^® Graphene has an in-plane modulus of 0.9TPa, compared to 1.0 TPa for Graphene produced by the Scotch Tape™ method.

Example of nanopatterning of an atomically thin matter-wave beam splitter from a single-layer Graphene on Holey Silicon Nitride product. 
Ref: C. Brand, et. al. Nature Nanotechnology, Vol. 10, Oct. 2015