{"product_id":"height-calibration-standards","title":"Height Calibration Standards","description":"\u003cp\u003e\u003ca href=\"https:\/\/www.budgetsensors.com\/\"\u003e\u003cimg alt=\"\" src=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0909\/0452\/7174\/files\/BS-logo.png?v=1779784298\"\u003e\u003c\/a\u003e\u003c\/p\u003e\n\u003cp style=\"text-align: center;\"\u003e\u003ciframe width=\"938\" height=\"536\" src=\"https:\/\/www.youtube.com\/embed\/gQIRek27YK0\" title=\"BudgetSensors HS Series AFM Height Calibration Standards\"\u003e\u003c\/iframe\u003e\u003c\/p\u003e\n\u003chr\u003e\n\u003ch1\u003e\u003cspan style=\"color: rgb(0, 170, 255);\"\u003eHS-20MG\u003c\/span\u003e\u003c\/h1\u003e\n\u003ch2\u003e\u003cspan\u003eHeight Calibration Standard with 20nm Step Height\u003c\/span\u003e\u003c\/h2\u003e\n\u003ch3\u003e\u003cspan style=\"color: rgb(255, 128, 0);\"\u003eProduct Info\u003c\/span\u003e\u003c\/h3\u003e\n\u003cp\u003e\u003cspan\u003eAtomic Force Microscopy has become a valuable tool not only for visualization but also for performing accurate measurements on the nanometer and micrometer scale. In order to make the most of their measurement capabilities, AFM systems need to be properly calibrated.\u003c\/span\u003e\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003eHS-20MG\u003cspan\u003e \u003c\/span\u003e\u003c\/strong\u003eis one of the height standards introduced by\u003cspan\u003e \u003c\/span\u003e\u003cstrong\u003eBudget\u003c\/strong\u003e\u003cstrong\u003eSensors\u003cspan\u003e \u003c\/span\u003e\u003c\/strong\u003eas a response to the increased demand for affordable high-quality AFM calibration standards.\u003c\/p\u003e\n\u003cp\u003eThe\u003cspan\u003e \u003c\/span\u003e\u003cstrong\u003eHS-20MG\u003c\/strong\u003e\u003cspan\u003e \u003c\/span\u003efeatures silicon dioxide structure arrays on a 5x5mm silicon chip. The fabrication process guarantees excellent uniformity of the structures across the chip. This in turn ensures easy and reliable Z-axis calibration of your AFM system.\u003c\/p\u003e\n\u003cp\u003eThe calibration area is situated in the center of the chip. It is easy to find with the AFM optical system. The structure step height is in the range of\u003cspan\u003e \u003c\/span\u003e\u003cstrong\u003e20nm\u003c\/strong\u003e. The exact value for each chip is indicated on the box label.\u003c\/p\u003e\n\u003cp\u003eArrays of structures with different shape and pitch are integrated on the chip. The larger square (1×1mm) contains square pillars and holes with a 10µm pitch. The smaller square (500×500µm) contains circular pillars and holes as well as lines in the X- and Y-direction with a 5µm pitch.\u003c\/p\u003e\n\u003cp\u003eAside from Z-axis calibration, this design also allows X- and Y-axis calibration for bigger scanners (40-100µm range). What is more, the structure symmetry makes it possible to calibrate your AFM system without the need to rotate and realign the sample in-between X- and Y-axis calibration.\u003c\/p\u003e\n\u003cp\u003eThe\u003cspan\u003e \u003c\/span\u003e\u003cstrong\u003eHS-20MG\u003c\/strong\u003e\u003cspan\u003e \u003c\/span\u003echip is glued onto a 12mm metal disc using a high-quality electrically-conductive epoxy resin and it is ready for use as shipped. It is also available unmounted (\u003cstrong\u003eHS-20MG-UM\u003c\/strong\u003e).\u003c\/p\u003e\n\u003ch3\u003e\u003cspan style=\"color: rgb(255, 128, 0);\"\u003eTechnical data at a glance:\u003c\/span\u003e\u003c\/h3\u003e\n\u003cp\u003e\u003cstrong\u003eDie size:\u003cspan\u003e \u003c\/span\u003e\u003c\/strong\u003e5×5mm\u003cstrong\u003e\u003cbr\u003e\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003eStep height:\u003c\/strong\u003e\u003cspan\u003e \u003c\/span\u003e~20nm (the precise value is stated on the label of each box)\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003eStructure geometry:\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul\u003e\n\u003cli\u003esquare holes and pillars with a 10µm pitch arranged in a 1×1mm square\u003c\/li\u003e\n\u003cli\u003ecircular pillars and holes, and lines in the x- and y-direction with a 5µm pitch arranged in a 500×500µm squares\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cdiv class=\"techData tips clearfix\"\u003e\u003cbr\u003e\u003c\/div\u003e\n\u003cp style=\"text-align: center;\"\u003e\u003cimg src=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0909\/0452\/7174\/files\/73cf9345766862d4614057649d74d5a22509df67.jpg?v=1782116091\" alt=\"\"\u003e\u003c\/p\u003e\n\u003cp style=\"text-align: center;\"\u003e\u003cimg src=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0909\/0452\/7174\/files\/4124e610ba6e67d95d6b34d6131b0cc055f7ff29.gif?v=1782116124\" alt=\"\"\u003e\u003c\/p\u003e\n\u003chr\u003e\u003chr\u003e\n\u003ch1\u003e\u003cspan style=\"color: rgb(0, 170, 255);\"\u003eHS-100MG\u003c\/span\u003e\u003c\/h1\u003e\n\u003ch2\u003e\u003cspan\u003eHeight Calibration Standard with 100nm Step Height\u003c\/span\u003e\u003c\/h2\u003e\n\u003ch3\u003e\u003cspan style=\"color: rgb(255, 128, 0);\"\u003eProduct Info\u003c\/span\u003e\u003c\/h3\u003e\n\u003cp\u003eAtomic Force Microscopy has become a valuable tool not only for visualization but also for performing accurate measurements on the nanometer and micrometer scale. In order to make the most of their measurement capabilities, AFM systems need to be properly calibrated.\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003eHS-100MG\u003cspan\u003e \u003c\/span\u003e\u003c\/strong\u003eis one of the height standards introduced by\u003cspan\u003e \u003c\/span\u003e\u003cstrong\u003eBudget\u003c\/strong\u003e\u003cstrong\u003eSensors\u003cspan\u003e \u003c\/span\u003e\u003c\/strong\u003eas a response to the increased demand for affordable high-quality AFM calibration standards.\u003c\/p\u003e\n\u003cp\u003eThe\u003cspan\u003e \u003c\/span\u003e\u003cstrong\u003eHS-100MG\u003c\/strong\u003e\u003cspan\u003e \u003c\/span\u003efeatures silicon dioxide structure arrays on a 5×5mm silicon chip. The fabrication process guarantees excellent uniformity of the structures across the chip. This in turn ensures easy and reliable Z-axis calibration of your AFM system.\u003c\/p\u003e\n\u003cp\u003eThe calibration area is situated in the center of the chip. It is easy to find with the AFM optical system. The structure step height is in the range of\u003cspan\u003e \u003c\/span\u003e\u003cstrong\u003e100nm\u003c\/strong\u003e. The exact value for each chip is indicated on the box label.\u003c\/p\u003e\n\u003cp\u003eArrays of structures with different shape and pitch are integrated on the chip. The larger square (1×1mm) contains square pillars and holes with a 10µm pitch. The smaller square (500×500µm) contains circular pillars and holes as well as lines in the X- and Y-direction with a 5µm pitch.\u003c\/p\u003e\n\u003cp\u003eAside from Z-axis calibration, this design also allows X- and Y-axis calibration for bigger scanners (40-100µm range). What is more, the structure symmetry makes it possible to calibrate your AFM system without the need to rotate and realign the sample in-between X- and Y-axis calibration.\u003c\/p\u003e\n\u003cp\u003eThe\u003cspan\u003e \u003c\/span\u003e\u003cstrong\u003eHS-100MG\u003c\/strong\u003e\u003cspan\u003e \u003c\/span\u003echip is glued onto a 12mm metal disc using a high-quality electrically-conductive epoxy resin and it is ready for use as shipped. It is also available unmounted (\u003cstrong\u003eHS-100MG-UM\u003c\/strong\u003e).\u003c\/p\u003e\n\u003cdiv class=\"techDataBox\"\u003e\n\u003ch3\u003e\u003cspan style=\"color: rgb(255, 128, 0);\"\u003eTechnical data at a glance:\u003c\/span\u003e\u003c\/h3\u003e\n\u003cp\u003e\u003cstrong\u003eDie size:\u003c\/strong\u003e\u003cspan\u003e \u003c\/span\u003e5×5mm\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003eStep height:\u003c\/strong\u003e\u003cspan\u003e \u003c\/span\u003e~100nm (the precise value is stated on the label of each box)\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003eStructure geometry:\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul\u003e\n\u003cli\u003esquare holes and pillars with a 10µm pitch arranged in a 1×1mm square\u003c\/li\u003e\n\u003cli\u003ecircular pillars and holes, and lines in the x- and y-direction with a 5µm pitch arranged in a 500×500µm squares\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cp style=\"text-align: center;\"\u003e\u003cimg src=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0909\/0452\/7174\/files\/73cf9345766862d4614057649d74d5a22509df67.jpg?v=1782116091\" alt=\"\"\u003e\u003c\/p\u003e\n\u003cp style=\"text-align: center;\"\u003e\u003cimg src=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0909\/0452\/7174\/files\/529fbff6b12b61ef7251df3a97e37df9546083d1.gif?v=1782116438\" alt=\"\"\u003e\u003c\/p\u003e\n\u003chr\u003e\n\u003chr\u003e\n\u003ch1\u003e\u003cspan style=\"color: rgb(0, 170, 255);\"\u003eHS-500MG\u003c\/span\u003e\u003c\/h1\u003e\n\u003ch2\u003e\u003cspan class=\"sub-heading\"\u003eHeight Calibration Standard with 500nm Step Height\u003c\/span\u003e\u003c\/h2\u003e\n\u003ch3\u003e\u003cspan style=\"color: rgb(255, 128, 0);\"\u003eProduct Info\u003c\/span\u003e\u003c\/h3\u003e\n\u003cp\u003eAtomic Force Microscopy has become a valuable tool not only for visualization but also for performing accurate measurements on the nanometer and micrometer scale. In order to make the most of their measurement capabilities, AFM systems need to be properly calibrated.\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003eHS-500MG\u003cspan\u003e \u003c\/span\u003e\u003c\/strong\u003eis one of the height standards introduced by\u003cspan\u003e \u003c\/span\u003e\u003cstrong\u003eBudget\u003c\/strong\u003e\u003cstrong\u003eSensors\u003cspan\u003e \u003c\/span\u003e\u003c\/strong\u003eas a response to the increased demand for affordable high-quality AFM calibration standards.\u003c\/p\u003e\n\u003cp\u003eThe\u003cspan\u003e \u003c\/span\u003e\u003cstrong\u003eHS-500MG\u003c\/strong\u003e\u003cspan\u003e \u003c\/span\u003efeatures silicon fioxide structure arrays on a 5×5mm silicon chip. The fabrication process guarantees excellent uniformity of the structures across the chip. This in turn ensures easy and reliable Z-axis calibration of your AFM system.\u003c\/p\u003e\n\u003cp\u003eThe calibration area is situated in the center of the chip. It is easy to find with the AFM optical system. The structure step height is in the range of\u003cspan\u003e \u003c\/span\u003e\u003cstrong\u003e500nm\u003c\/strong\u003e. The exact value for each chip is indicated on the box label.\u003c\/p\u003e\n\u003cp\u003eArrays of structures with different shape and pitch are integrated on the chip. The larger square (1×1mm) contains square pillars and holes with a 10µm pitch. The smaller square (500×500µm) contains circular pillars and holes as well as lines in the X- and Y-direction with a 5µm pitch.\u003c\/p\u003e\n\u003cp\u003eAside from Z-axis calibration, this design also allows X- and Y-axis calibration for bigger scanners (40-100µm range). What is more, the structure symmetry makes it possible to calibrate your AFM system without the need to rotate and realign the sample in-between X- and Y-axis calibration.\u003c\/p\u003e\n\u003cp\u003eThe\u003cspan\u003e \u003c\/span\u003e\u003cstrong\u003eHS-500MG\u003c\/strong\u003e\u003cspan\u003e \u003c\/span\u003echip is glued onto a 12mm metal disc using a high-quality electrically-conductive epoxy resin and it is ready for use as shipped. It is also available unmounted (\u003cstrong\u003eHS-500MG-UM\u003c\/strong\u003e).\u003c\/p\u003e\n\u003cdiv class=\"techDataBox\"\u003e\n\u003ch3\u003e\u003cspan style=\"color: rgb(255, 128, 0);\"\u003eTechnical data at a glance:\u003c\/span\u003e\u003c\/h3\u003e\n\u003cp\u003e\u003cstrong\u003eDie size:\u003c\/strong\u003e\u003cspan\u003e \u003c\/span\u003e5×5mm\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003eStep height:\u003c\/strong\u003e\u003cspan\u003e \u003c\/span\u003e~500nm (the precise value is stated on the label of each box)\u003c\/p\u003e\n\u003cp\u003e\u003cstrong\u003eStructure geometry:\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul\u003e\n\u003cli\u003esquare holes and pillars with a 10µm pitch arranged in a 1×1mm square\u003c\/li\u003e\n\u003cli\u003ecircular pillars and holes, and lines in the x- and y-direction with a 5µm pitch arranged in a 500×500µm squares\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cp style=\"text-align: center;\"\u003e\u003cimg src=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0909\/0452\/7174\/files\/73cf9345766862d4614057649d74d5a22509df67.jpg?v=1782116091\" alt=\"\"\u003e\u003c\/p\u003e\n\u003cp style=\"text-align: center;\"\u003e\u003cimg src=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0909\/0452\/7174\/files\/9bb76c2e878a9bf8bfcdd88d0f3cbd2e63fb9ca1.gif?v=1782116636\" alt=\"\"\u003e\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e","brand":"BudgetSensors","offers":[{"title":"HS-20MG Height Calibration Standard with 20nm Step Height on 12mm dia. metal disc (Unit: each)","offer_id":56832410124614,"sku":"HS-20MG","price":1412.1,"currency_code":"RON","in_stock":true},{"title":"HS-20MG Height Calibration Standard with 20nm Step Height, unmounted (Unit: each)","offer_id":56832410157382,"sku":"CS-20MG-UM","price":4123.33,"currency_code":"RON","in_stock":true},{"title":"HS-100MG Height Calibration Standard with 100nm Step Height on 12mm dia. metal disc (Unit: each)","offer_id":56832560922950,"sku":"HS-100MG","price":1412.1,"currency_code":"RON","in_stock":true},{"title":"HS-100MG Height Calibration Standard with 100nm Step Height, unmounted (Unit: each)","offer_id":56832565215558,"sku":"HS-100MG-UM","price":1412.1,"currency_code":"RON","in_stock":true},{"title":"HS-500MG Height Calibration Standard with 500nm Step Height on 12mm dia. metal disc (Unit: each)","offer_id":56832569147718,"sku":"HS-500MG","price":1412.1,"currency_code":"RON","in_stock":true},{"title":"HS-500MG Height Calibration Standard with 500nm Step Height, unmounted (Unit: each)","offer_id":56832571408710,"sku":"HS-500MG-UM","price":1412.1,"currency_code":"RON","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0909\/0452\/7174\/files\/73cf9345766862d4614057649d74d5a22509df67.jpg?v=1782116091","url":"https:\/\/allemee.com\/products\/height-calibration-standards","provider":"AllEm","version":"1.0","type":"link"}